| 纳米器件中的1／f噪声分析及其低噪声化处理 |
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| 引用本文： | 易鸿.纳米器件中的1／f噪声分析及其低噪声化处理[J].渝西学院学报(自然科学版),2010(1):50-52,60. |
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| 作者姓名： | 易鸿 |
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| 作者单位： | 四川文理学院物理与工程技术系; |
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| 基金项目： | 四川文理学院科研项目(2007B03Z) |
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| 摘 要： | 阐述了纳米电子器件中1/f噪声的产生机理，分析了单电子晶体管1/f噪声产生的各种原因，并用介观效应的原理，揭示出宏观样品中产生1/f噪声的实质．最后，得出一种针对纳米单电子器件低噪声化处理的方法．
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| 关 键 词： | 纳米器件 介观系统 1／f噪声 |
The 1/f noise analysis and low-noise processing in nanoelectronics |
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| Authors: | YI Hong |
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| Institution: | YI Hong(Department of Physics , Engineering Technology,Sichuan University of Arts , Sciences,Dazhou Sichuan 635000,China) |
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| Abstract: | The reasons of existence for 1/f noise in nanoelectronics were explained;varies of reasons for 1/f noise were analyzed,and the principle of mesoscopics effect was applied to reveal the essence of real noise in macro-samples.Finally,single-electron devices for nanoelectronics low-noise method of treatment were put forward. |
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| Keywords: | nanoelectronics mesoscopic systems 1/f noise |
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