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短时认知过程中40Hz脑电事件相关电位分析
引用本文:王永红,杨浩,等.短时认知过程中40Hz脑电事件相关电位分析[J].重庆大学学报(自然科学版),2001,24(2):64-67.
作者姓名:王永红  杨浩
作者单位:[1]重庆医科大学临床学院,重庆400016 [2]重庆大学电气工程
基金项目:重庆市卫生局资助项目,99,
摘    要:研究了正常人在安静和思维状态下阵发性40Hz脑电事件相关信号(40Hz ERP)的特征变化,探讨阵发性40Hz ERP与年龄、性别、文化程度和智力测验得分之间的关系,同时对40Hz ERP不同参数进行比较。结果表明:正常人在安静状态下阵发性40Hz ERP低于视空间测试。思维活动时阵发性40Hz ERP增加幅度与简易精神状态量表(MMSE)和韦氏成人智力量表(WAIS)得分呈正相关。

关 键 词:事件诱发电位  认知活动  脑电图  短时认知过程  脑电事件
文章编号:1000-582x(2001)02-0064-04
修稿时间:2000年6月13日

Analysis on 40 Hz ERP During Brain Transient Cognitive Performance
WANG Yong-hong,DONG Wei-wei,YANG Hao.Analysis on 40 Hz ERP During Brain Transient Cognitive Performance[J].Journal of Chongqing University(Natural Science Edition),2001,24(2):64-67.
Authors:WANG Yong-hong  DONG Wei-wei  YANG Hao
Abstract:In this investigation 50 normal subjects were observed. Activities of EEG of 8 areas on both hemisphere during six different states were recorded. The author analyzed time ( T ), area( A ) and amplitude ( Amp ) of burst 40 Hz ERP recorded during different states and investigate the correlation's between 40 Hz ERP and age, sex,education background and scores of IQ. The time, area and amplitude of burst 40 Hz ERP are all significantly lower during rest states than those during orientation test, calculation test and visual spatial task test. During thinking process the increase of burst 40 Hz ERP is positive correlated with the scores in MMSE and WAIS. T is the most stable and sensitive marker. A affected by T and Amp, is stable but less sensitive than T. Amp is less sensitive than T and A.
Keywords:40 Hz ERP  thinking process  EEG
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