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厚度对多孔PTFE/PE/PP驻极体电荷储存稳定性的影响
引用本文:江键,宋茂海,崔黎丽,王小平. 厚度对多孔PTFE/PE/PP驻极体电荷储存稳定性的影响[J]. 北京理工大学学报, 2005, 25(Z1): 129-132
作者姓名:江键  宋茂海  崔黎丽  王小平
作者单位:1. 第二军医大学,基础部,上海,200433
2. 第二军医大学,药学院,上海,200433
摘    要:研究由不同厚度多孔聚四氟乙烯(PTFE)组成的多孔PTFE/聚乙烯(PE)/聚丙烯(PP)驻极体的电荷储存稳定性.通过热融法和电晕充电技术将多孔PTFE,PE,PP复合膜制备成驻极体,并采用等温表面电位衰减测量、电荷TSD和扫描电子显微镜研究多孔PTFE/PE/PP驻极体的电荷储存稳定性.结果表明:较厚的多孔PTFE组成的多孔PTFE/PE/PP驻极体在低温区呈现出较好的电荷储存能力;多孔PTFE的孔洞越多,由其组成的多孔PTFE/PE/PP驻极体在高温区的电荷储存能力越强;在高湿环境下,多孔PTFE/PE/PP驻极体比多孔PTFE驻极体显示出更好的电荷储存稳定性.

关 键 词:驻极体  多孔聚四氟乙烯  聚乙烯  聚丙烯  IEC标准  厚度  多孔聚四氟乙烯  PTFE  驻极体  电荷储存  储存稳定性  影响  Porous  Charge Storage Stability  Thickness  Influence  体显示  高湿环境  高温区  孔洞  能力  低温区  结果  电子显微镜  扫描
文章编号:1001-0645(2005)增刊-129-04
修稿时间:2005-06-10

Influence of Thickness on the Charge Storage Stability for Porous PTFE/PE/PP Film Electrets
JIANG Jian,SONG Mao-hai,CUI Li-li,WANG Xiao-ping. Influence of Thickness on the Charge Storage Stability for Porous PTFE/PE/PP Film Electrets[J]. Journal of Beijing Institute of Technology(Natural Science Edition), 2005, 25(Z1): 129-132
Authors:JIANG Jian  SONG Mao-hai  CUI Li-li  WANG Xiao-ping
Abstract:The charge storage stability investigate has been for porous polytetrafluoroehtylene(PTFE) /polyethylene (PE)/polypropylene(PP) electret film.The porous PTFE, PE, and PP were made into the porous PTFE / PE/PP electret by means of heat melting and corona charging. The charge storage stability of the electret was measured by using methods of isothermal surface potential decay, charge TSD and scanning electron microscope. The Results show that the porous PTFE/PE/PP electret prepared from thicker porous PTFE showed better charge storage stability at low temperature area. The more of the porosity for the porous PTFE, the better charge storage stability of the porous PTFE/PE/PP electret at high temperature area. The porous PTFE/PE/PP electret exhibited more excellent charge storage stability than porous PTFE electret under the high humidity circumstance.
Keywords:electret  porous polytetrafluoroehtylene  polyethylene  polypropylene  charge stability
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