| 数字逻辑电路实验故障“三步分析法” |
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| 引用本文： | 陈俊梅,高海娟,周晋阳. 数字逻辑电路实验故障“三步分析法”[J]. 实验室科学, 2010, 13(5): 105-106. DOI: 10.3969/j.issn.1672-4305.2010.05.034 |
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| 作者姓名： | 陈俊梅 高海娟 周晋阳 |
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| 作者单位： | [1]长治医学院生物医学工程系,山西长治046000 [2]北京邮电大学世纪学院通信与信息工程系,北京102613 |
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| 摘 要： | 数字逻辑电路实验故障时有发生,实验者由于查找排除方法的使用不当,经常会遇上误工费时却又不能很好解决故障的现象。本文介绍一种查找数字逻辑电路实验故障的方法—＂三步分析法＂,使实验者不需要了解故障类型也能快速查出并及时排除故障,该方法不仅能提高实验效率,而且有助于实验者在自行排查和掌握各种故障的过程中养成良好的实验习惯,提高实验者分析问题和解决问题能力。
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| 关 键 词： | 数字逻辑电路实验 实验故障 三步分析法 |
Three-step analyzing method for the digital logic circuit experiment failure |
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| CHEN Jun-mei,GAO Hai-juan,ZHOU Jin-yang. Three-step analyzing method for the digital logic circuit experiment failure[J]. Laboratory Science, 2010, 13(5): 105-106. DOI: 10.3969/j.issn.1672-4305.2010.05.034 |
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| Authors: | CHEN Jun-mei GAO Hai-juan ZHOU Jin-yang |
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| Affiliation: | 1.Department of Biological Medical Engineering,Chang Zhi Medical College,Changzhi 046000,China;2.Department of Communication and Information Engineering of Century College,Beijing University of Posts and Telecommunications,Beijing 102613,China) |
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| Abstract: | Failure always occurs during the digital logic circuit experiment.If operator cannot take suitable strategies to find failures,it will waste much time and be difficult to solve problems.This paper introduces a method to find failures in digital logic circuit experiment — the three-step analyzing method.By using this method,operator can find failure quickly and clear them in time without the knowledge of failure type.This method not only can improve experiment efficiency,but also is helpful to foster operator＇s good experimental habit during the process of finding and mastering kinds of failures independently and enhance operator＇s abilities of analyzing and solving problems. |
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| Keywords: | digital logic circuit experiment experiment failure three-step analyzing method |
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