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一种基于EMD的模拟电路故障特征提取方法
引用本文:侯青剑,王宏力. 一种基于EMD的模拟电路故障特征提取方法[J]. 系统工程与电子技术, 2009, 31(6): 1525-1528
作者姓名:侯青剑  王宏力
作者单位:第二炮兵工程学院控制科学与工程系, 陕西, 西安, 710025
摘    要:为克服小波分析中混频现象对模拟电路故障特征提取造成的不准确,提出了一种基于经验模式分解的模拟电路故障特征提取方法。该方法通过对模拟电路输出信号进行EMD得到若干个内禀模态函数,以各IMF的能量作为故障判别的特征。并针对EMD中的端点效应问题,提出了基于遗传优化的最小二乘支持向量机预测方法。仿真实验结果证明了该方法的有效性。

关 键 词:模拟电路  故障特征  经验模式分解  端点效应  最小二乘支持向量机  遗传算法
收稿时间:2008-02-09
修稿时间:2008-04-17

Method of fault feature extraction for analog circuits based on EMD
HOU Qing-jian,WANG Hong-li. Method of fault feature extraction for analog circuits based on EMD[J]. System Engineering and Electronics, 2009, 31(6): 1525-1528
Authors:HOU Qing-jian  WANG Hong-li
Affiliation:Dept. of Control Science and Engineering, The Second Artillery Engineering Inst., Xi’an 710025, China
Abstract:To overcome the imprecision of fault feature extraction for analog circuits because of the mixing phenomenon of wavelet analysis,a method of fault feature extraction for analog circuits based on empirical mode decomposition(EMD) is put forward.The method gets several intrinsic mode functions(IMF) through the EMD of analog circuit output signals,and the energy of each IMF is regard as the feature to distinguish faults.Aiming at the problem of end effect on EMD,a predictive method of least square support vector machines(LSSVM) based on genetic optimization is put forward.The results of simulation experiment prove the validity of this method.
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