| 用电镜测定银簿膜的厚度 |
| |
| 引用本文： | 金太权.用电镜测定银簿膜的厚度[J].吉林工学院学报,1989,10(4):70-73. |
| |
| 作者姓名： | 金太权 |
| |
| 作者单位： | 吉林工学院基础科学系 |
| |
| 摘 要： | 本文详细讨论了利用电镜测定银薄膜厚度的原理和方法。主要内容有，电子对银散射截面的计算和薄膜厚度与电子束的相对电流密度关系的计标。
|
| 关 键 词： | 电子显微镜 银薄膜 厚度 测量方法 测量原理 |
The Measurement of Thickness of a Thin Silver Film by Electron Microscope |
| |
| Jin Taiquan,The Basic Science.The Measurement of Thickness of a Thin Silver Film by Electron Microscope[J].Journal of Jilin Institute of Technology,1989,10(4):70-73. |
| |
| Authors: | Jin Taiquan The Basic Science |
| |
| Institution: | Jin Taiquan
The Basic Science Department |
| |
| Abstract: | This paper has discussed in detail the principle and method of measuring the thickness of a silver film by means of an electron microscope. The majar topics discussed are: calculation of the electron scattering cross-section and the relationship between the thickness of the film and the relative intensity of the electronic beam. |
| |
| Keywords: | electron microscopes determination thin films thickness |
| 本文献已被 CNKI 维普 等数据库收录！ |
