| 扫描Kelvin探针研究缺陷涂层的膜下腐蚀电化学行为 |
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| 引用本文： | 李迎超,高瑾,李晓刚,董超芳,肖葵.扫描Kelvin探针研究缺陷涂层的膜下腐蚀电化学行为[J].北京科技大学学报,2010,32(9). |
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| 作者姓名： | 李迎超 高瑾 李晓刚 董超芳 肖葵 |
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| 作者单位： | 北京科技大学材料科学与工程学院,北京,100083;北京市腐蚀、磨蚀与表面技术重点实验室,北京,100083 |
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| 基金项目： | 科技部国家科技基础条件平台建设资助项目 |
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| 摘 要： | 应用扫描Kelvin探针原位研究盐雾和干湿周浸环境中缺陷涂层膜下的腐蚀行为.结果显示:在两种腐蚀环境中,缺陷涂层均分为缺陷、阴极剥离及完好涂层区域;Kelvin电位的分布相同,缺陷处最高,完整涂层处最低.Kelvin电位分布峰的直径随时间的延长而增大,表明剥离区域扩大.干湿周浸环境中,Kelvin电位的最大值Vmax随时间变化不明显,Vmin在逐渐下降后达到谷值,随后升高;盐雾环境中由于电解质溶液持续扩散和盐雾颗粒极强的腐蚀性,Kelvin电位随时间的变化规律为Vmin在起始阶段达到最小值,随后升高.由Vmax-Vmin的变化规律得出,干湿周浸环境下腐蚀倾向性在试验开始5h后达到最大,而在盐雾环境下,试验开始阶段腐蚀倾向性就达到最大,且要高于干湿周浸环境.
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| 关 键 词： | 涂层 缺陷 电化学腐蚀 扫描Kelvin探针 |
Research of electrochemical corrosion behavior under coatings with defects by scanning Kelvin probe |
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| LI Ying-chao,GAO Jin,LI Xiao-gang,DONG Chao-fang,XIAO Kui.Research of electrochemical corrosion behavior under coatings with defects by scanning Kelvin probe[J].Journal of University of Science and Technology Beijing,2010,32(9). |
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| Authors: | LI Ying-chao GAO Jin LI Xiao-gang DONG Chao-fang XIAO Kui |
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| Institution: | LI Ying-chao1,2),GAO Jin1,LI Xiao-gang1,DONG Chao-fang1,XIAO Kui1,2)1) School of Materials Science , Engineering,University of Science , Technology Beijing,Beijing 100083,China2) Beijing Key Laboratory for Corrosion,Erosion , Surface Technology,China |
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| Abstract: | The corrosion behavior under coatings with a point defect was investigated in situ by means of scanning Kelvin probe in both salt spray test and cyclic wet-dry immersion test.The results showed that the Kelvin potential distribution was identical in both the tests due to the same division of coating surfaces:defect area with the highest potential,delaminated area,and intact area with the lowest potential.Through monitoring the augment of diameter of Kelvin potential peaks with time,the expansion of the dela... |
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| Keywords: | coatings defects electrochemical corrosion scanning Kelvin probe |
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