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射频磁控溅射制备c轴取向LiNbO3薄膜研究
引用本文:安玉凯,左长云,刘技文.射频磁控溅射制备c轴取向LiNbO3薄膜研究[J].天津理工大学学报,2011,27(4):1-4.
作者姓名:安玉凯  左长云  刘技文
作者单位:天津理工大学天津市光电显示材料与器件重点实验室,天津,300191
基金项目:天津市科技计划项目(10SYSYJC28100)
摘    要:采用射频磁控溅射技术,用富Li的LiNbO3靶材在Si(100)和Si(111)基底上制备了LiNbO3薄膜.通过X射线衍射仪(XRD)、扫描电子显微镜(SEM)和X射线光电子能谱(XPS)对LiNbO3薄膜的结晶程度、晶体取向和表面形貌及薄膜与基底结合处的界面结构进行了研究.结果表明:样品在空气中经1 000℃退火1 h处理后,薄膜与Si基底界面处有SiO2生成,得到的LiNbO3薄膜结晶性好,具有高c轴取向,晶粒排列致密且粒径尺寸均匀.

关 键 词:LiNbO3薄膜  c轴取向  射频磁控溅射

The preparation of highly c-axis oriented LiNbO3 thin film by rf-sputtering
AN Yu-kai,ZUO Chang-yun,LIU Ji-wen.The preparation of highly c-axis oriented LiNbO3 thin film by rf-sputtering[J].Journal of Tianjin University of Technology,2011,27(4):1-4.
Authors:AN Yu-kai  ZUO Chang-yun  LIU Ji-wen
Institution:AN Yu-kai,ZUO Chang-yun,LIU Ji-wen(Tianjin Key Laboratory for Photoelectric Materials and Devices,Tianjin University of Technology,Tianjin 300191,China)
Abstract:LiNbO3 thin films were grown on Si substrates by radio-frequency(RF) magnetron sputtering technique with a LiNbO3 with Li-riched target.The crystallization,crystalline orientation and surface morphology of the films were characterized with X-ray diffraction(XRD),scanning electron microscopy(SEM).The interface between LiNbO3 film and Si substrate was investigated by X-ray photoelectron spectroscopy(XPS).The results show that the films have highly c-axis oriented texture,uniform grain size and a smooth,crack-...
Keywords:LiNbO3 thin film  c-axis orientation  rf-sputtering  
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