X射线辐射对环氧树脂固化物介电性能和微观结构的影响研究

在不同时长和能量的X射线辐射下,对固化后环氧树脂电绝缘材料的介电性能和微观结构的变化情况进行研究。使用柱-柱电极、介电谱仪、高阻仪对辐射过的环氧树脂进行了击穿场强测试、介电常数测量、电阻率测量。用扫描电镜(SEM)、X射线衍射仪(XRD)对辐射过后的环氧树脂进行了微观形貌测量,材料的结晶度、结晶尺寸测量。结果表明:X射线辐射对固化后的环氧树脂的介电性能、微观结构和外貌特征均有影响,环氧树脂的介电性能与其微观结构有着密切的关系。

Fig.1 Epoxy resin film

Under the X-ray radiation in different duration and energy, the changes of dielectric properties and microscopic structure of cured epoxy resin have been researched. Use column-column electrode, dielectric spectrometer, high resistance meter carried on Breakdown voltage test, the dielectric constant and resistivity measurement of cured epoxy resin; microstructure, crystallinity and crystal size have been tested by Scanning electron microscopy (SEM) and X-ray diffractometer (XRD). The results showed that: X-ray radiation has influence on the dielectric properties, microstructure and physical characteristics of cured epoxy resin. The dielectric properties of the epoxy resin have a close relationship with its microstructure.