| 半导体表面薄膜的有效量子限制长度和极化子研究 |
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| 引用本文： | 李华,刘炳灿,田强.半导体表面薄膜的有效量子限制长度和极化子研究[J].北京师范大学学报(自然科学版),2017,53(4):395-398. |
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| 作者姓名： | 李华 刘炳灿 田强 |
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| 作者单位： | 装甲兵工程学院基础部,100072,北京;北京师范大学物理学系,100875,北京 |
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| 基金项目： | 国家自然科学基金资助项目 |
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| 摘 要： | 采用提出的等效方法, 确定AlxGa1-xAs衬底上GaAs表面薄膜的量子限制长度, 在此基础上确定了GaAs薄膜的分数维, 进一步利用分数维方法研究了AlxGa1-xAs衬底上GaAs表面薄膜中的极化子特性.
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| 关 键 词： | 有效量子限制长度 分数维方法 极化子 GaAs薄膜 |
Effective length of quantum confinement and polaron characteristics in semiconductor surface films |
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| LI Hua,LIU Bingcan,TIAN Qiang.Effective length of quantum confinement and polaron characteristics in semiconductor surface films[J].Journal of Beijing Normal University(Natural Science),2017,53(4):395-398. |
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| Authors: | LI Hua LIU Bingcan TIAN Qiang |
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| Institution: | 1)Department of Fundamental Courses,Academy of Armored Force Engineering,100072,Beijing,China;
2)Department of Physics,Beijing Normal University,100875,Beijing,China |
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| Abstract: | Within the framework of fractional-dimensional space approach,the effective length of quantum confinement is determined by an equivalent method.Result of binding energy and effective mass of a polaron confined in a GaAs film deposited on an AlxGa1 x substrate for different aluminum concentration at different values of film thickness have been investigated. |
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| Keywords: | effective length of quantum confinement fractional-dimensional approach polaron GaAs film |
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