Institution: | SHEN Shu-Po ZHANG Bing-Lin, HE Jin-Tian WANG Jian-En(Henan Fundamental and Applied Science Research Institute, Zhengzhou University, Zhengzhou 450052, PRC)Howard R. Shanks, Moeljanto W. Leksono and Bob Girvan(Microelectronics Research Center, Iowa State University, Ames, Iowa, USA) |