钢铁渗硅层孔隙成因的探讨

根据金相显微镜、显微硬度计、X-射线衍射仪、离子微分析仪及精密膨胀仪的测试结果,认为渗硅层孔隙的成因,还与被渗材料中的非金属夹杂物和渗层中的内应力有关。由此,提高渗硅温度、延长渗硅保温时间,以及采用膨胀系数和渗层相近、无同素异构转变、体心立方晶格的金属材料作为被渗材料,可减少孔隙的数量和改善孔隙的形状。

Investigation on the pore formation in the siliconized layers of steel and iron

Three established assumptions relating to the pores formation process in the siliconized layer of carbon steel, Armco, etc. have been investigated. Confirmed by the observed results from metalloscope, microhardness meter, X-ray diffraction meter, ion microanalyzer and dilatometer, etc., it appears that the presence of the non-metallic inclusions in the siliconized beds and the inner stress in the siliconized layer must be able to exert some ruling action upon the pore formation. Accordingly, any raising of the siliconizing temperature, keeping the time of silieonizing longer and the careful adoption of the appropriaet bee metals, the siliconizing materials, which possesses the approximately equal coefficient of expansion of the subequent siliconized layer but without any allotropic transformation resulted, will be able to oppress the amount of pore formed and offer better configuration of the pore as desired, too.