模拟线性电路中故障元件存在范围的确定

为了简化模拟线性电路故障诊断定位阶段的工作量，提出了1种确定故障元件存在范围的方法.即在十分现实的K故障假设下，确定能代表电路所有元件并给出在K故障假设下的故障诊断方程的唯一解的1组元件--最优可测试元件组，使故障定位工作只局限于该组元件，而不必对电路所有元件进行.该方法构成了故障定位的第一步，且与故障定位方法无关.方法基于电路的可测试值计算和规范式不确定性组的确定，它在可测试性与不确定性组概念中具有严格的理论基础，其可测试性计算可直接从参数类型故障诊断技术中推得.

A Method of Determining the Existent Range of Fault Elements in Analog Linear Circuits

In order to simplify the hard work for the fault location in the fault diagnosis of analog linear circuit a procedure for determining the existent range of fault elements is presented;i.e. by assuming the quite realistic k-fault hypothesis,a group of elements that represent all the circuit elements and give a unique solution for the fault diagnosis equations under the k-fault hypothesis is determined.This group is called an optimum set of testable elements.Therefore the work for fault location can only operate in the elements of this group and does not need to perform in all the circuit elements.So the method constitutes the first step in the development of whatever procedure for the fault location of analog linear circuits.The proposed procedure is based on the testability evaluation of the circuit and on the determination of the canonical ambiguity groups and has its theoretical foundation in testability concept and in the canonical ambiguity group concept.The testability evaluation can be deduced by referring to fault diagnosis techniques of the parametric kind.