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应用撕裂法诊断模拟电路单支路故障
引用本文:陈秀祥,杨祖樱.应用撕裂法诊断模拟电路单支路故障[J].福州大学学报(自然科学版),1990(2):52-57.
作者姓名:陈秀祥  杨祖樱
作者单位:福州大学电气系 (陈秀祥),福州大学电气系(杨祖樱)
摘    要:撕裂法对于模拟电路的故障诊断是一种有效的方法.本文在文[1]的基础上更深一步地研究了 撕裂法应用于单支路故障诊断时选择检验变量的依据,给出了单支路可诊断的拓扑条件,进而完成了 对网络单支路故障的定位定值计算.

关 键 词:撕裂法  检验变量  可诊断性

Application of Tearing Method to Single-Branch-Fault Diagonsis of Anolog Circuits
Chen Xiuxiang,Yang Zuying.Application of Tearing Method to Single-Branch-Fault Diagonsis of Anolog Circuits[J].Journal of Fuzhou University(Natural Science Edition),1990(2):52-57.
Authors:Chen Xiuxiang  Yang Zuying
Institution:Department of Electrical Engineering
Abstract:Tearing method is effective in fault daignosis of anolog circuits. In this paper, the results of a further study of reference 1] is presented, and the rules for determinig the check variable and the topological conditions for single-branch diagnosibility are provided. An ex- ample for the location of fault and the calculation of its value are given.
Keywords:tearing method  check variable  diagnosibility
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