| 安培力微观机制的研究 |
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| 引用本文： | 艾彤,陈清梅,邢红军.安培力微观机制的研究[J].首都师范大学学报(自然科学版),2012,33(3):13-16. |
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| 作者姓名： | 艾彤 陈清梅 邢红军 |
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| 作者单位： | 1. 首都师范大学物理系,北京,100048
2. 北京中医药大学基础教学部,北京,100102 |
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| 摘 要： | 关于安培力的微观机制前人已经进行了大量的研究,本文在前人的基础上提出了新的观点：将金属导体的安培力定义为晶格正电荷受到的合力,并在两种不同的参考系中进行了论证,从而得出了相同的结论.
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| 关 键 词： | 安培力 微观机制 晶格正电荷 参考系 |
Micromechanism of Ampere Force Research |
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| Ai Tong
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Chen Qingmei
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Xing Hongjun.Micromechanism of Ampere Force Research[J].Journal of Capital Normal University(Natural Science Edition),2012,33(3):13-16. |
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| Authors: | Ai Tong Chen Qingmei Xing Hongjun |
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| Institution: | 1(1.Department of Physics,Capital Normal University,Beijing 10048,China; 2.Department of Basic Teaching,Beijing University of Chinese Medicine,Beijing 100029,China) |
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| Abstract: | About the micromechanism of ampere force,predecessors have carried out extensive research.On the basis of predecessors’ new views are put forward in this paper.The metal conductor ampere force is defined as resultant force of lattice positive charged.The point is demonstrated in two different reference systems which come to the same conclusion. |
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| Keywords: | ampere force micromechanism lattice positive charged reference system |
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