温度应力下功能退化型加速寿命试验问题研究

该文针对研究无线电引信长期贮存可靠性，根据电子元器件参数随贮存时间变化的规律，确定并建立温度为应力的功能退化型加速寿命试验模型。根据加速寿命试验结果推出一般状态下电子元器件的性能变化规律，通过阿伦尼斯模型推导出加速寿命系数。该文还对加速系数和激活能进行了进一步讨论，并就线性规律、指数规律和幂函数规律等几种常见的功能退化规律，推导出加速系数和激活能计算公式，并通过实例计算出产品的综合激活能。

Study on Accelerated Life Test of Function Degenerating Type by Temperature Stress

This paper studied reliability of radio fuze for long time storage. Because parameters of electronic component are changed with storage time, the function degenerating type accelerated life test model is established and built by temperature stress.According to the result of accelerated life test,the performance variation law of electronic components in common condition is deduced,and the accelerated life factor is derived from Arrhenius model.Furthermore, this paper studied accelerated factor and activation energy, deduced accelerated factor and calculational formula of activation energy by several kinds of familiar function degenerating law such as linear function,exponential function and idempotent function, and then calculated the production's integrated activation energy by example.