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磁光盘原始误码特性的测试
引用本文:吴裕斌,曹丹华,阮玉. 磁光盘原始误码特性的测试[J]. 华中科技大学学报(自然科学版), 1998, 0(1)
作者姓名:吴裕斌  曹丹华  阮玉
作者单位:华中理工大学光电子工程系!430074
基金项目:国家“八五”军事电子预研重点项目!7B.2.2.2
摘    要:介绍了测试磁光盘原始误码特性的基本原理,提出了特征误码脉冲宽度硬件判读和误码个数硬件统计方法,具体阐述了测试模块的设计思想.研制的测试模块兼有测试盘片漏码和突发码的功能,并可实现阈值电平、填充信号频率等参数的自动调节.

关 键 词:磁光存储  误码率  测试

Testing of Raw Bit Error Characteristics of Magneto-Optical Disks
Wu Yubin,Cao Danhua,Ruan Yu. Testing of Raw Bit Error Characteristics of Magneto-Optical Disks[J]. JOURNAL OF HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY.NATURE SCIENCE, 1998, 0(1)
Authors:Wu Yubin  Cao Danhua  Ruan Yu
Affiliation:Wu Yubin;Cao Danhua;Ruan Yu
Abstract:The principle of testing the raw bit error characteristics of magneto-optical (MO) disks is described. A new method of the discrimination of feature error pulse width and the counting of error bits by hardwares is put forward. With the method, the problem of catching and storing large amount of random feature pulses can be solved. The testing module developed has the function of testing drop bit and burst bit, and also has the ability to automatically adjust the threshold voltage and the filling signal frequency. Not only the bit error characteristics of MO disks can be evaluated in an all-round way, but also the maximum storage line density of disks can be determined.
Keywords:magneto-optical storage  bit error rate  testing
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