Detection of coaxial backscattered electrons in SEM |
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Authors: | Jiang Chang-zhong Ren Da-zhi |
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Institution: | (1) Department of Physics, Wuhan University, 430072 Wuhan, China |
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Abstract: | We present a coaxial detection of the backscattered electrons in SEM. The lens-aperture has been used to filter in energy
and focus the backscattered electrons. This particular geometry allows us to eliminate the low energy backscattered electrons
and collect the backscattered electrons, which are backscattered close to the incident beam orientation. The main advantage
of this geometry is adapted to topographic contrast attenuation and atomic number contrast enhancement. Thus this new SEM
is very suitable to analyze the material composition.
Foundation item: Supported by the National Natural Science Foundation of China (10045001)
Biography: JIANG Chang-zhong (1962-), male, Ph. D, Associate professor. |
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Keywords: | scanning electron microscopy backscattered electrons coaxial detection |
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