| 基于自构建多窗体结构的多目标匹配算法 |
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| 引用本文： | 郗安民,朱欣昱,谢飞.基于自构建多窗体结构的多目标匹配算法[J].北京科技大学学报,2008,30(1):96-100. |
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| 作者姓名： | 郗安民 朱欣昱 谢飞 |
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| 作者单位： | 北京科技大学机械工程学院,北京,100083 |
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| 基金项目： | 国家高技术研究发展计划资助项目(No.2004AA31g080) |
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| 摘 要： | 针对大批量芯片生产中视觉检测难题,提出了一种基于多窗体结构的多目标匹配算法,实现了多窗体结构的自构建.结合螺旋形特征链对最多近似点距离(MCD)进行了改进,提高了算法速度和鲁棒性.通过实验证实:该算法较好地完成了大批量芯片识别任务;该算法除了具有高速度和高精确度的优点之外,还具有其他算法不具备的柔性.
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| 关 键 词： | 视觉检测 芯片生产 多窗体 最多近似点距离(MCD) |
| 收稿时间： | 2006-09-31 |
| 修稿时间： | 2007-03-16 |
Mass-target image matching algorithm based on self-constructed multi-window |
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| XI Anmin,ZHU Xinyu,XIE Fei.Mass-target image matching algorithm based on self-constructed multi-window[J].Journal of University of Science and Technology Beijing,2008,30(1):96-100. |
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| Authors: | XI Anmin ZHU Xinyu XIE Fei |
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| Abstract: | An algorithm of mass-target image matching for vision measurement in mass chip production was put forward to carry out multi-window self-construction.Spiral character chain was used to modify maximum close distance(MCD)for improving the speed and robustness.Experimental results confirm that the assignment of recognizing mass chips is achieved by the algorithm.Beside the advantages of high speed and precision,it is flexible compared with other algorithms. |
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| Keywords: | vision measurement chip production multi-window maximum close distance(MCD) |
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