| 可测性设计技术的回顾与发展综述 |
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| 引用本文： | 王厚军.可测性设计技术的回顾与发展综述[J].中国科技论文在线,2008(1):52-58. |
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| 作者姓名： | 王厚军 |
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| 作者单位： | 电子科技大学,成都610054 |
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| 基金项目： | 总装预研重点基金（51317040102）; 博士点基金（20070614018） |
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| 摘 要： | 介绍了可测性定义、起源和发展过程,简要分析了国内可测性技术的现况和存在问题。对可测性建模、度量、基本方法、相关国际标准、可测性设计平台和可测性技术发展趋势等几个核心问题进行了探讨。
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| 关 键 词： | 测量与仪器 可测性设计 内嵌自测试 边界扫描 |
Reviews of testability design technology |
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| WANG Houjun.Reviews of testability design technology[J].Sciencepaper Online,2008(1):52-58. |
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| Authors: | WANG Houjun |
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| Institution: | WANG Houjun ( University of Electronic Science and Technology of China, Chengdu 610054 ) |
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| Abstract: | The origin, definition and development of testability technology are briefly introduced. The current research status and existing problems on testability technology in China are analyzed. Some issues are discussed in detail, e.g., the testability modeling, testability measurement, international standard, testability design platform and its developing trends. |
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| Keywords: | measurement and instrument design for testability built in self test boundary scan |
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