纱条不匀的功率谱分析与微机实现

本文的第一部分讨论了理想纱条与实际纱条的功率谱,不仅给出了比以往更严格的理论公式,而且通过将纱条不匀分解成几个基本平稳过程之和,讨论了实际纱条功率谱密度的典型形式。同时,还指出乌斯特波长谱与均方根谱密度属于不同的概念:前著既不表征 CV 值的波长分布,也不可与理想纱条的均方根谱密度相比。本文的第二部分提出了用十六位微处理器 Intel 8086实现纱条不匀谱分析的设想,并完成了其主要软件(包括一定点 FFT 子程序)的设计与调试。将 IBM-PC 与乌斯特传感器联机的实验结果表明,功率谱能在功能上代替乌斯特波长谱。本系统的算法简单而高效,与乌斯特仪器相比,不仅成本很低,且其功能和灵活性将更胜一筹。

A POWER SPECTRAL ANALYSIS OF THE IRREGULARITY OF YARNS AND SLIVERS AND THE APPLICATION OF A MICROPROCESSOR

In the first part of this paper,the formula of the PSD of ideal sliver is more rigor-ously deduced than before,and the typical forms of the PSD of actual sliver is discussedby decomposing sliver into three basle stationary processes.Meanwhile,Uster wave-length spectrum and the mean square root of PSD are of different concepts:neitherdoes the former represent the distribution of CV,nor can it be compared with the meansquare root PSD of the ideal sliver.In the second part,a project for the realization of spectral analysis with a 16-bitmicroprocessor,Intel 8086,is presented.Its major software (including a fixed-pointFFT subroutine) has been designed and tested.Actual datum analysis has also beenmade on an IBM-PC/XT,the signal of a Uster monitor is connected to the computer.It shows that PSD can perform the function of Uster spectrum.Simple as it is,ouralgorithm is of high-efficiency.The system will be much cheaper in cost as comparedwith a Usher tester,and what is more,its function and flexibility is much better.