| A New Method for the Detections of Multiple Faults Using Binary Decision Diagrams |
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| 引用本文： | PAN Zhongliang CHEN Ling ZHANG Guangzhao. A New Method for the Detections of Multiple Faults Using Binary Decision Diagrams[J]. 武汉大学学报:自然科学英文版, 2006, 11(6): 1943-1946. DOI: 10.1007/BF02831913 |
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| 作者姓名： | PAN Zhongliang CHEN Ling ZHANG Guangzhao |
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| 作者单位： | [1]School of Physics and Telecommunications Engineering, South China Normal University, Guangzhou 510631, Guangdong, China [2]Department of Electronics, Sun Yat-sen University, Guangzhou 510275, Guangdong, China |
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| 摘 要： | With the complexity of integrated circuits is continually increasing, a local defect in circuits may cause multiple faults. The behavior of a digital circuit with a multiple fault may significantly differ from that of a single fault. A new method for the detection of multiple faults in digital circuits is presented in this paper, the method is based on binary decision diagram （BDD）. First of all, the BDDs for the normal circuit and faulty circuit are built respectively. Secondly, a test BDD is obtained by the XOR operation of the BDDs corresponds to normal circuit and faulty circuit. In the test BDD, each input assignment that leads to the leaf node labeled 1 is a test vector of multiple faults. Therefore, the test set of multiple faults is generated by searching for the type of input assignments in the test BDD. Experimental results on some digital circuits show the feasibility of the approach presented in this paper.
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| 关 键 词： | 数字电路 多重故障 故障检测 二元判定图 EDD |
| 文章编号： | 1007-1202（2006）06-1943-04 |
| 收稿时间： | 2006-04-20 |
A new method for the detections of multiple faults using binary decision diagrams |
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| Pan Zhongliang,Chen Ling,Zhang Guangzhao. A new method for the detections of multiple faults using binary decision diagrams[J]. Wuhan University Journal of Natural Sciences, 2006, 11(6): 1943-1946. DOI: 10.1007/BF02831913 |
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| Authors: | Pan Zhongliang Chen Ling Zhang Guangzhao |
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| Affiliation: | (1) School of Physics and Telecommunications Engineering, South China Normal University, 510275 Guangzhou, Guangdong, China;(2) Department of Electronics, Sun Yat-sen University, 510275 Guangzhou, Guangdong, China |
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| Abstract: | With the complexity of integrated circuits is continually increasing, a local defect in circuits may cause multiple faults. The behavior of a digital circuit with a multiple fault may significantly differ from that of a single fault. A new method for the detection of multiple faults in digital circuits is presented in this paper, the method is based on binary decision diagram (BDD). First of all, the BDDs for the normal circuit and faulty circuit are built respectively. Secondly, a test BDD is obtained by the XOR operation of the BDDs corresponds to normal circuit and faulty circuit. In the test BDD, each input assignment that leads to the leaf node labeled 1 is a test vector of multiple faults. Therefore, the test set of multiple faults is generated by searching for the type of input assignments in the test BDD. Experimental results on some digital circuits show the feasibility of the approach presented in this paper. |
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| Keywords: | digital circuits multiple faults fault detection binary decision diagrams |
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