| 用X射线衍射法测定聚酰亚胺薄膜取向结构 |
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| 引用本文： | 李辉只,忻济民,杨保京,张和康.用X射线衍射法测定聚酰亚胺薄膜取向结构[J].上海交通大学学报,1987(2). |
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| 作者姓名： | 李辉只 忻济民 杨保京 张和康 |
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| 作者单位： | 上海交通大学应用化学系
(李辉只，忻济民，杨保京)，上海交通大学应用化学系(张和康) |
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| 摘 要： | 聚酰亚胺薄膜的取向结构对机械性能影响很大。薄膜取向结构可以用普通的x射线衍射方法,从x 射线入射方向垂直和平行于薄膜平面两个方向进行测定,在这个测定中,我们制作了一个槽盖压紧样品架,用于进行入射x 射线平行于薄膜平面方向的测定。测试结果可表明被测薄膜的取向类型和取向程度,在理论研究和制造工艺上都有重要的意义。
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| 关 键 词： | 聚酰亚胺 薄膜 取向结构 薄膜性能 x 射线衍射 针孔照相 结构测定 |
The Determination of Orientational Degree of Polyimide Films by X-Ray Diffraction Method |
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| Li Huizhi Xin Jimin Yang Baojing Zhang Hekang.The Determination of Orientational Degree of Polyimide Films by X-Ray Diffraction Method[J].Journal of Shanghai Jiaotong University,1987(2). |
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| Authors: | Li Huizhi Xin Jimin Yang Baojing Zhang Hekang |
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| Institution: | Li Huizhi Xin Jimin Yang Baojing Zhang Hekang |
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| Abstract: | The orientational degree of a polyimide film has a significant effect on its
mechanical properties.The oriented structure of polyimide films can easily be
detected by the X-Ray diffraction method keeping the incident X-Ray in two direct-
ions:one perpendicular to the surface of the film and the other parallel with it.In
the experiment,a compression sample holder with a grooved cover was specially
designed to keep the X-Ray in parallel with the surface of the film.The
experimental results show clearly the type and extent of the orientation of the
different films. |
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| Keywords: | polyimide film orientation structure film property X-Ray diffraction pin hole photograph determination of structure |
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