| Abstract: | The Electroluminescence thin films of zinc sulfide do ped with erbium, fabricated by thermal evaporation with two boats, are analyzed by the technology of X-ray diffraction (XRD) and X-ray photoelectron spectrosc opy (XPS). The relationship between electroluminescence brightness and microst ructure of the thin films is obtained. The analysis results of XRD indicate th at the fabricated zinc sulfide thin films belong to the blende structure and hav e a trend of preferential orientation. The XPS measureme... |
