关于Sauer引理的一个推广

Sauer引理是统计学习理论中的基本结论．在许多实际问题中，需要研究N类模式识别问题．本文将Sauer引理推广到N类分类问题．     

乙醇三维内微肋热管的传热性能

采用实验研究的方法对三维内微肋热管的强化传热特性进行研究，首次报道了以乙醇为工质的三维内微肋热管的传热性能。在实验范围内，与光管相比，竖直放置时，沸腾换热系数可以提高98％—190％，凝结换热系数可以提高76％—178％。三维内微肋结构能够同时明显地强化热管的沸腾换热与凝结换热，可以有效地减小热管的内热阻。     

Interaction-based quantum metrology showing scaling beyond the Heisenberg limit

Quantum metrology aims to use entanglement and other quantum resources to improve precision measurement. An interferometer using N independent particles to measure a parameter χ can achieve at best the standard quantum limit of sensitivity, δχ?∝?N(-1/2). However, using N entangled particles and exotic states, such an interferometer can in principle achieve the Heisenberg limit, δχ?∝?N(-1). Recent theoretical work has argued that interactions among particles may be a valuable resource for quantum metrology, allowing scaling beyond the Heisenberg limit. Specifically, a k-particle interaction will produce sensitivity δχ?∝?N(-k) with appropriate entangled states and δχ?∝?N(-(k-1/2)) even without entanglement. Here we demonstrate 'super-Heisenberg' scaling of δχ?∝?N(-3/2) in a nonlinear, non-destructive measurement of the magnetization of an atomic ensemble. We use fast optical nonlinearities to generate a pairwise photon-photon interaction (corresponding to k = 2) while preserving quantum-noise-limited performance. We observe super-Heisenberg scaling over two orders of magnitude in N, limited at large numbers by higher-order nonlinear effects, in good agreement with theory. For a measurement of limited duration, super-Heisenberg scaling allows the nonlinear measurement to overtake in sensitivity a comparable linear measurement with the same number of photons. In other situations, however, higher-order nonlinearities prevent this crossover from occurring, reflecting the subtle relationship between scaling and sensitivity in nonlinear systems. Our work shows that interparticle interactions can improve sensitivity in a quantum-limited measurement, and experimentally demonstrates a new resource for quantum metrology.