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The film morphology of dodecyl/carboxyl modified polysiioxane (RCAS) on cotton fabric or the silicon wafer was investigated and characterized by field emission scanning electron microscopy ( FESEM ),atomic force microscope ( AFM ),and Fourier transform infrared spectrometer (FTIR).Experimental results indicate that RCAS is a good film forming material on different substrates.Relatively smooth film was formed on cotton fabric surface,on which the grooves disappeared.In addition,RCAS formed a micromorphology inhomogeneous and unsmooth film on the silicon wafer.Many high or low bright peaks distributed randomly on the film surface,especially as the field was 2μm ×2 μmand the date scale was 5 nm in AFM observation.Then RCAS was emulsified with nonionic surfactant alkyl polyoxyethylene ether in order to achieve a transparent organosilicon emulsion-RCAS emulsion ( RCSE),which possessed good stability.The properties of RCSE and its application performance on cotton fabrics were investigated and characterized by transmission electron microscope (TEM),particle size analysis,and voltage test instrument.The results show that the average particle size of RCAS emulsion is 28.32 nm,while the ζ voltage is - 37.88 mV.Compared with untreatd cotton fabric,the.softness of treated fabric can be improved with RCSE to a certain extent.At the.same time,the fabric treated with RCSE acquires unique fluffy and soft handle.  相似文献   
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