X射线实时成像电缆检测系统设计

研究了利用X射线实时成像技术实现电缆检测的方法.采用双路系统完成了两个方向的尺寸检测.避免了圆周扫描检测的同心度不良问题;对实时成像系统分辨率影响因素进行了分析.提出了合理的解决方案,实现了多层交联电缆中半导层和绝缘层的尺寸检测.     

AN INVESTIGATION ON MICROWAVE DYEING OF COTTON FABRICS

This paper deals with the dyeing of cotton fabrics with microwave irradiation.The compara-tive experiments of the microwave dyeing to the conventional dyeing were carried out and themechanism was also discussed.Being subjected to microwave irradiation,the penetration of dyesand chemicals into the fabric can be achieved in a short time with a good color yield.The irradiatedmaterials generate heat via dielectric heating by high frequency electro-magnetic field and as a re-sult,energy saving can be realized.Based on the examination and analysis with X-ray diffraction,IR,SEM,and XPS,the reduction in crystallinity,the formation of active carbonyl groups of freeradicals containing oxygen and the morphological changes in the irradiated cottom fibers werefound.All of these may be believed in favour of the dyeing process.     

含He纳米钛膜的XRD研究

本文采用直流磁控溅射方法,在He／Ar混合气氛中,通过分别改变He／Ar流量比和沉积偏压制备不同He含量的钛膜。利用XRD(X-ray diffraction)对含He钛膜的微观结构和晶粒尺寸进行了研究。结果表明,在其它实验参数不变的情况下,当He／Ar流量比从1.0增加到25时,钛膜的平均晶粒尺寸从19.02nm减小到8.63nm。随着膜中He含量的增加,衍射峰宽化,晶粒细化,He的掺入有抑制纳米晶粒长大的趋势。而当沉积偏压从24V增加到151V时,其平均晶粒尺寸基本不变。He引入引起了（002）晶面衍射峰向小角度移动,晶格参数c增加,而a不变。     

基于小波分析的X线医学图像噪声综合抑制方法

提出了一种基于小波分析理论的医学X线图像噪声的综合抑制方法．将X线图像的试验处理结果与邻域平均、中值滤波去噪处理方法进行对比分析，结果表明该方法不仅能消除噪声提高图像质量，而且有效地保留了影像中丰富的细微影纹和边缘信息．     

十水草酸澜的热分解

本文用热分析的方法─—热重（ＴＧ），差热分析（ＤＴＡ）对十水草酸镧的热分解机理进行研究。提出其热分解过程的五个步骤：＋水物→九水物→二水物→无水物→一碳酸二氧盐→氧化物。在热分解阶段的中间产物（一碳酸二氧盐）用红外光谱和ｘ－射线衍射仪进行了测定。     

5-溴-2-羟基苯基苯甲酮苯甲酰腙的合成及晶体结构

由5-溴-2-羟基苯基苯甲酮和苯甲酰肼通过缩合反应,合成了一种新的芳香酰腙化合物:5-溴-2-羟基苯基苯甲酮苯甲酰腙.通过X射线单晶衍射对该化合物进行晶体结构的表征.研究表明,该酰腙为单斜晶系,空间群为P2(1)/c,晶胞学数据为a=17.505(5)nm,α=90.00°,b=13.761(4)nm,β=94.546(6)°,c=7.219(2)nm,γ=90.00°.V=1733.4(9)nm3,Z=4,μ=2.387mm-1,Dc=1.515mg/m3,F(000)=672,Final R indices[I>2sigma(I)]R1=0.0439,wR2=0.0813 R1=0.1051[I>2sigma(I)],wR2=0.1007(all data).     

在扫描电镜中用x射线荧光法(SEM-EDXRF)测硅衬底上铝膜厚度

在以前的工作中,我们实现了扫描电镜中的x射线荧光分析(SEM-EDXRF),得到了较理想的原级x射线束。现在,我们又利用SEM-EDXRF方法测量了硅片上的铝膜厚度,其原理是测量由衬底发出的x射线荧光强度。对硅片上有不同厚度铝膜样品测量结果表明,衬底的x射线荧光强度的对数与膜厚成线性关系,并与理论符合很好。本实验预示了在扫描电镜中利用EDXRF方法测微区膜厚的可能性。     

XPS研究多壁碳纳米管的阳极氧化处理效果

采用阳极氧化法对多壁碳纳米管（MWNTs）进行表面处理以提高其表面极性官能团含量。研究了不同电解参数对MWNTs处理结果的影响，采用X射线光电子能谱对处理前后的MWNTs的表面特征进行了分析。结果表明，经阳极氧化处理后，MWNTs表面氧原子摩尔分数与极性官能团总量均有不同程度增加。通电量和碱性电解质的电导率（物质的量浓度）是阳极氧化处理过程的主要影响因素，MWNTs表面极性官能团总量的增加可以归结为羟基的增加和羰基的减少，另外还探讨了可能的氧化反应机理。     

医学X光非标视频自适应转换系统的研究与实现

针对不同厂家X光非标医学视频技术参数不统一,无法直接接驳通用DVI、XVGA、S-Video等通用视频接口的现状,在研究建立非标准视频信号特征转换算法库的基础上,应用高速FPGA数字系统现场集成技术,采用在VHDL硬件描述语言编程设计的方法,很好地实现了高分辨X光非标医学视频的自适应转换,方便了临床X光影像的辩识。     

New-corrected functions of X-ray powder diffraction

X-ray powder diffraction is an indispensable technique to study material structure, phase transition and so on. It is necessary for high quality diffraction data to get high-precision diffraction angle. This work proposed four corrected functions of X-ray powder diffraction angle. Two methods, linearization method and modified Levenberg-Marquardt iteration method, are given to solve the function parameters, and the modified Levenberg-Marquardt method has fast convergent speed and stable solution. Two methods can give closed parameters, including those of Lu, Liu, and Chu functions and polynomial. New-corrected functions were used to fit the diffraction angle error of the tetragonal rutile polycrystalline TiO2 mixed with Gd0.45Y2.55Sc2Ga3O12 as a standard sample, and the computation result indicates that these functions can characterize the diffraction error very well. In some cases, the new-corrected functions can describe the diffraction angle error better than the reported corrected functions. At the same time, the lattice parameter of Gdo.45Y2.55Sc2Ga3O12 was computed with two methods. When the corrected function parameters and lattice parameters were solved by the least square method, the interaction of the function parameters and lattice parameters would result in great error. However, when the X-ray diffraction angles were corrected by corrected functions using a standard sample, the authentic lattice parameters can be obtained by the least square fitting.