Tracking an object through feature space

Visual attention allows an observer to select certain visual information for specialized processing. Selection is readily apparent in 'tracking' tasks where even with the eyes fixed, observers can track a target as it moves among identical distractor items. In such a case, a target is distinguished by its spatial trajectory. Here we show that one can keep track of a stationary item solely on the basis of its changing appearance--specified by its trajectory along colour, orientation, and spatial frequency dimensions--even when a distractor shares the same spatial location. This ability to track through feature space bears directly on competing theories of attention, that is, on whether attention can select locations in space, features such as colour or shape, or particular visual objects composed of constellations of visual features. Our results affirm, consistent with a growing body of psychophysical and neurophysiological evidence, that attention can indeed select specific visual objects. Furthermore, feature-space tracking extends the definition of visual object to include not only items with well defined spatio-temporal trajectories, but also those with well defined featuro-temporal trajectories.     

Controlled surface charging as a depth-profiling probe for mesoscopic layers

Probing the structure of material layers just a few nanometres thick requires analytical techniques with high depth sensitivity. X-ray photoelectron spectroscopy (XPS) provides one such method, but obtaining vertically resolved structural information from the raw data is not straightforward. There are several XPS depth-profiling methods, including ion etching, angle-resolved XPS (ref. 2) and Tougaard's approach, but all suffer various limitations. Here we report a simple, non-destructive XPS depth-profiling method that yields accurate depth information with nanometre resolution. We demonstrate the technique using self-assembled multilayers on gold surfaces; the former contain 'marker' monolayers that have been inserted at predetermined depths. A controllable potential gradient is established vertically through the sample by charging the surface of the dielectric overlayer with an electron flood gun. The local potential is probed by measuring XPS line shifts, which correlate directly with the vertical position of atoms. We term the method 'controlled surface charging' and expect it to be generally applicable to a large variety of mesoscopic heterostructures.