扫描隧道显微镜电压脉冲法加工产生纳米结构的研究

采用扫描隧道显微镜（ＳＴＭ）电压脉冲法，在大气环境中进行了纳米级超微加工的实验研究，分别用钨探针和镀金钨探针，以高定向热解石墨（ＨＯＰＧ）和金薄膜为样品，通过在ＳＴＭ探针和样品之间施加一定的电压脉冲，制造出了尺度在纳米量级的结构，对形成的结构特征进行了分析，并总结了部分实验规律。     

光子扫描隧道显微镜四介质三界面模型

修改了光子扫描隧道显微镜（ＰＳＴＭ）的三介质二界面模型，提出了比较符合ＰＳＴＭ探测实际的四介质三界面理论模型。给出了在这一新的理论模型下光子扫描隧道显微镜探测场的理论计算公式。对光子扫描隧道显微镜的实际探测具有理论指导意义     

近场光显微镜的研究

近场光显微镜（ＮＦＯＭ）是一种高分辩率的扫描探针显微镜。通过对ＮＦＯＭ的发展、原理进行了论述，并提出了一个实用的ＮＦＯＭ系统，完成了从扫描检测到计算机采集处理以及图象处理分析的全部工作。应用该系统，成功地对光栅、玻璃等样品采集成象，并进行了一些分析。结果表明该系统分辨率达到１００ｎｍ以上，ＮＰＯＭ对非导体材料特别是生物材料有着广阔的应用前景。     

高分辨扫描隧道显微镜研制及在生命科学中的应用进展

高分辨扫描隧道显微镜研制及在生命科学中的应用进展１９９１年Ｆｅｒｅｌ等利用光子隧道效应研制成功首台光子扫描隧道显微镜（ＰＳＴＭ），１９９３年我校物理系与中科院北京电镜室共同研制成功我国第一台ＰＳＴＭ，分辨率达１０ｎｍ，并通过专家鉴定。ＰＳＴＭ由于本身...     

基于针式传感器的多功能扫描探针显微镜

为了克服传统的扫描探针显微镜（ＳＰＭ）在应用中的不足，采用微石英晶振来取代传统ＳＰＭ的具有复杂结构的微悬臂的激光位移检测装置，使成本极大地下降。通过对锯齿型光栅试件的检测，证明这种检测方法是可行的。同时在微石英昌振前端安装不同种类的细针，可实现ＳＴＭ，ＡＦＭ，ＭＦＭ与ＥＦＭ的测量，构成一机多能系统。     

用于超精微观形貌检测的STM研制

研制了一种具有原子级和纳米级分辨率的宽范围扫描隧道显微镜（ＳＴＭ），通过理论分析和实验论证，介绍纳米级精度微进给机构的原理及特点，研究了一种适于该仪器的简易、有效的隔振系统及探针夹持方法，并对夹持精度进行分析，实验结果表明该仪器可用于原子级与纳米级精度微观形貌的检测。     

STM式三维nm级轮廓仪的研究

基于ＳＴＭ式三维ｎｍ级轮廓仪的检测原理、检测系统，研究了与其相关的检测技术．该轮廓仪可直接测量较大工件，扫描范围为１４０μｍ×１４０μｍ，分辨率达ｎｍ级．最后对工作台扫描非线性及扫描控制技术进行讨论，并利用多项式拟合法补偿工作台扫描的非线性误差，进而提出了一种平滑反馈扫描技术．     

扫描隧道显微镜针尖的电化学腐蚀制备方法

本文利用电化学腐蚀方法设计并搭建了一种扫描隧道显微镜（ＳＴＭ）针尖制备的直流腐蚀电路。电路中使用了９０１３三极管和ＬＭ３１１快速比较器，使电解池切断时间低于５００ｎｓ。成功地制备了质量较高的钨针类。     

nm级制造用三维微定位的扫描探针显微镜

介绍一种用于ｎｍ级制造具有ｘｙｚ三维微定位能力的扫描探针显微镜（ＳＰＭ）．采用电磁足周期性地夹紧与松开，结合压电陶管的轴向伸缩变形的微位移爬行器构成三维微定位机构．扫描范围可达２０μｍ×２０μｍ，且探针可在样品表面ｘ和ｙ方向上１０ｍｍ×１０ｍｍ范围内实行ｎｍ级的定位．探针在ｚ方向接近样品表面也可自动进行．给出了微定位器的运动分辨率、速度与工作频率，以及在扫描道显微（ＳＴＭ）方法下测得的高定向石墨表面原子图像     

电化学扫描微探针技术在固—液界面表征和修饰中的应用

固－液界面（主要指电化学界面）是进行物理化学过程的重要场所,而界面的微观结构起着十分关键的作用。电化学扫描探针显微镜（ＥＣＳＰＭ）已成为研究固－液界面结构的有力的工具。主要包括电化学扫描隧道显微镜（ＥＣＳＴＭ）、电化学原子力显微镜（ＥＣＡＦＭ）和扫描电化学显微镜（ＳＥＣＭ）。结合实验室近年来的研究工作和最新结果。从方法论的角度讨论ＥＣＳＰＭ特点、固－液体系在ＥＣＳＰＭ表面研究和表面修饰加工中所具有     

光子扫描隧道显微镜光纤探针的研制及显微成象研究

探讨了光子扫描隧道显微成象系统中光纤探针对经样品调制后的倏逝场的探测机理；着重研究了光纤探针的腐蚀加工工艺，同时具体分析了单模、多模光纤探针不同的显微成象特点，并与理论数值模拟计算结果相比较；最终应用于多种样品的显微成象，为纳米级分辨的光子扫描隧道显微镜的研制奠定了基础．     

光子扫描隧道显微技术

根据对内全反射(TIR)棱镜表面成指数衰减规律倏逝场的检测和分析,本文叙述了一种新型的光子扫描隧道显微技术(PSTM),被分析的样品置于棱镜表面,它空间调制了上述倏逝场。通过对被调制倏逝场的检测获得了远小于光波波长的空间分辩能力.PSTM实验系统中使用了633nm 的 He-Ne 激光,用直径约300nm 的光纤探针对不同薄膜样品进行检测,其结果与光隧道理论相符。     

High resolution imaging using scanning ion conductance microscopy with improved distance feedback control

Microscopy is an essential technique for observation on living cells. There is currently great interest in apply scanning probe microscopy to image living biological cells in their natural environment at the nanometer scale. Scanning ion conductance microscopy is a new form of scanning probe microscopy, which enables non-contact high resolution imaging of living biological cells. Based on a scanned nanopipette in physiological buffer, the distance feedback control uses the ion current to control the distance between the pipette tip and the sample surface. However, this feedback control has difficulties over slopes on convoluted cell surfaces, which limits its resolution. In this study, we present an improved form of feedback control that removes the contribution of up to the third order slope from the ion current signal, hence providing a more accurate signal for controlling the distance. We show that this allows faster and lower noise topographic high resolution imaging.     

PSTM四层介质理论探测场的数值模拟

使用最新光子扫描隧道显微镜探测场的理论计算公式，采用比较符合实际探测的理论模型，对ＰＳＴＭ探测场进行了计算机数据模拟，对探测场分布随扫描控制参量的变化规律进行了系统的研究，     

光子扫描隧道显微镜光探针的研究

本文推导了光子扫描隧道显微镜(PSTM)系统扫描器压电偏转量的计算公式,给出了实用的光纤探针制备过程,提出了一种测试毫微米级偏转量和偏转线性的光学方法,并做了实际测试,从而给出了PSTM系统提高分辨和扫描范围的途径,解决了系统信息采集部分的一些理论和技术问题。     

High resolution imaging using scanning ion conductance microscopy with improved distance feedback control

Microscopy is an essential technique for observation on living cells. There is currently great interest in applying scanning probe microscopy to image-living biological cells in their natural environment at the nanometer scale. Scanning ion conductance microscopy is a new form of scanning probe microscopy, which enables non-contact high-resolution imaging of living biological cells. Based on a scanned nanopipette in physiological buffer, the distance feedback control uses the ion current to control the distance between the pipette tip and the sample surface. However, this feedback control has difficulties over slopes on convoluted cell surfaces, which limits its resolution. In this study, we present an improved form of feedback control that removes the contribution of up to the third-order slope from the ion current signal, hence providing a more accurate signal for controlling the distance. We show that this allows faster and lower noise topographic high-resolution imaging.     

Hard-tip, soft-spring lithography

Nanofabrication strategies are becoming increasingly expensive and equipment-intensive, and consequently less accessible to researchers. As an alternative, scanning probe lithography has become a popular means of preparing nanoscale structures, in part owing to its relatively low cost and high resolution, and a registration accuracy that exceeds most existing technologies. However, increasing the throughput of cantilever-based scanning probe systems while maintaining their resolution and registration advantages has from the outset been a significant challenge. Even with impressive recent advances in cantilever array design, such arrays tend to be highly specialized for a given application, expensive, and often difficult to implement. It is therefore difficult to imagine commercially viable production methods based on scanning probe systems that rely on conventional cantilevers. Here we describe a low-cost and scalable cantilever-free tip-based nanopatterning method that uses an array of hard silicon tips mounted onto an elastomeric backing. This method-which we term hard-tip, soft-spring lithography-overcomes the throughput problems of cantilever-based scanning probe systems and the resolution limits imposed by the use of elastomeric stamps and tips: it is capable of delivering materials or energy to a surface to create arbitrary patterns of features with sub-50-nm resolution over centimetre-scale areas. We argue that hard-tip, soft-spring lithography is a versatile nanolithography strategy that should be widely adopted by academic and industrial researchers for rapid prototyping applications.     

使用碳纳米管AFM针尖的蛋白质高分辨率成像

原子力显微镜(AFM)是分析生物分子结构的有效手段,而目前使用的探针针尖的性质限制了高分辨率图像的获得。该文将碳纳米管安装到原子力显微镜的传统针尖上,制作出碳纳米管针尖以解决这个问题。运用碳纳米管针尖在大气常温条件下获得了由3个单元组成的小鼠抗体IgG蛋白质的Y形结构,并且分子的尺寸与X射线晶体衍射的结果非常接近,这种效果用传统针尖是无法获得的。获得的蛋白质分子超微结构的高分辨率图像为研究蛋白质分子功能提供了有价值的信息。