Characterization of Cu3P phase in Sn3.0Ag0.5Cu0.5P/Cu solder joints

This article reports the effects of phosphorus addition on the melting behavior, microstructure, and mechanical properties of Sn3.0Ag0.SCu solder. The melting behavior of the solder alloys was determined by differential scanning calorimetry. The interracial micro- structure and phase composition of solder/Cu joints were studied by scanning electron microscopy and energy dispersive spectrometry. Thermodynamics of Cu-P phase formation at the interface between Sn3.0Ag0.5Cu0.5P solder and the Cu substrate was characterized. The results indicate that P addition into Sn3.0Ag0.5Cu solder can change the microstructure and cause the appearance of rod-like CuaP phase which is distributed randomly in the solder bulk. The Sn3.0Ag0.5Cu0.5P joint shows a mixture of ductile and brittle fracture after shear test- ing. Meanwhile, the solidus temperature of Sn3.0Ag0.5Cu solder is slightly enhanced with P addition.     

Effects of nano-sized Ag reinforcing particulates on the microstructure of Sn-0.7Cu solder joints

Composite solders were prepared by mechanically dispersing different volumes of nano-sized Ag particles into the Sn-0.7Cu eutectic solder. The effects of Ag particle addition on the microstructure of Sn-0.7Cu solder joints were investigated. Besides, the effects of isothermal aging on the microstructural evolution in the interfacial intermetallic compound (IMC) layer of the Sn-0.7Cu solder and the composite solder reinforced with 1vol% Ag particles were analyzed, respectively. Experimental results indicate that the growth rate of the interfacial IMC layer in the Ag particles reinforced composite solder joint is much lower than that in the Sn-0.7Cu solder joint during isothermal aging. The Ag particles reinforced composite solder joint exhibits much lower layer-growth coefficient for the growth of the IMC layer than the corresponding solder joint.     

BGA封装中含Bi,Ni的无铅焊球剪切强度研究

对Sn/3.5Ag/0.7Cu,Sn/3Ag/3Bi/0.5Cu和Sn/3Ag/3Bi/0.5Cu/0.1Ni三种BGA无铅焊球(0.76 mm)经不同热循环后,在FR-4基板上的剪切强度进行了测量.采用SEM和EDX对样品截面进行观察和元素分析.数据表明,Bi的掺入提高了焊料的润湿性及焊接强度,并减缓了IMC的生长速度;焊料中加入微量Ni可有效减小焊点下金属上Ni镀层的耗穿速度,抑制了焊球经热循环后焊接强度的下降.     

Influence of Temperature on Creep Behavior of Ag Particle Enhancement SnCu Based Composite Solder

The creep properties of solder alloys are an important factor affecting the reliability of soldered joints in surface mount technologies. Particle-enhancement is one way to improve the properties of solder alloys. The temperature of the solder joint is one of the primary factors affecting the solder joint creep prop-erties. Single shear lap creep specimens with a 1 mm2 cross-sectional area were fabricated using Ag parti-cle enhancement 99.3Sn0.7Cu based composite solder and 99.3Sn0.7Cu eutectic solder to examine the in-fluence of temperature on the creep behavior of solder joints. The results show that the solder joint creep resistance of the composite solder joint was generally superior to that of the 99.3Sn0.7Cu solder joint. The creep rupture life of the composite solder joint was reduced by increasing temperatures at a faster rate than that of the 99.3Sn0.7Cu eutectic solder joint.     

ZnO whiskers growth on the surface of Sn9 Zn/Cu solder joints in concentrator silicon solar cells solder layer

ZnO whiskers observation on the surface of SnZn/Cu solder joints in concentrator silicon solar cells solder layer is reported.In the experiment, SnZn/Cu samples are left in laboratory after reflow soldering for two years before an examination by SEM, then ZnO whiskers can be observed obvious-ly, which grows out from the rich-Zn phase of the samples and causes electrical short circuit in the electronics appliances, which demonstrates that the SnZn solder shows a risk for the short circuiting failure of an electronic device.Moreover, the growth mechanism of ZnO whiskers is researched based on cracked oxide theory, which provides the reference support for SnZn solders application.     

Abnormal growth of Ag3Sn intermetalUc compounds in Sn-Ag lead-free solder

The abnormal growth of Ag3Sn intermetallic compounds in eutectic Sn-3.5% Ag solder was investigated through high-temperature aging treatment. Microstructural evolutions of this solder before and after the aging treatment were observed by optical microscopy and scanning electron microscopy. Precise differential thermal analysis was made to study the changes in enthalpies of the solder under different conditions. The results reveal that the water-cooled solder is in metastable thermodynamic state due to the high free energy of Ag3Sn nanoparticles, which sporadically distribute in the matrix as second-phase. The second-phase Ag3Sn nanoparticles aggregate rapidly and grow to form bulk intermetallic compounds due to the migration of grain boundary between primary Sn-rich phase and the Ag3Sn nanoparticles during high temperature aging treatment.     

Abnormal growth of Ag_3Sn intermetallic compounds in Sn-Ag lead-free solder

Tin-lead solders have been used for some 2000 years and applied widely in the assembly of modern elec-tronic circuits. However, Pb is harmful to the nervous system of human beings and hazardous to the environ-ment. The European Union directive on waste el…     

温度与镀层对Sn0.7Cu焊料合金润湿性的影响

主要研究了真空状态下,焊接温度为530,560和590 K时,Sn-0.7Cu焊料合金在镀Cu、镀Ni、镀Ni/Ag和镀Ni/Au基板上的润湿性.结果表明:提高钎焊时的焊接温度,有助于降低液态Sn-0.7Cu焊料合金的表面张力,从而增大Sn-0.7Cu焊料合金在焊接基板上的润湿性.在相同的焊接条件下,Sn-0.7Cu焊料合金在镀Ni/Ag和镀Ni/Au基板上的润湿性比其在Cu和镀Ni基板上的润湿性好.     

回流次数对Sn3.5Ag0.5Cu焊点特性的影响

研究了回流次数对Sn3．5Ag0．5Cu焊点特性的影响,采用扫描电镜SEM和光学显微镜对多次回流后Sn3．5Ag0．5Cu焊点界面金属间化合物（IMC）层的形貌和拉伸断裂断口形貌进行了分析．结果表明：随着回流次数的增加,焊点的宽度和金属间化合物的厚度增加;焊料和凸点下金属化层（UBM）之间界面上的IMC组织从针状逐渐粗化;焊料的拉伸强度有轻微变化;断裂面第一次回流焊后出现在焊料中,而多次回流焊后断裂面部分出现在焊料中,部分出现在UBM和焊料的界面中．     

Electrochemical migration behaviors of lead-free 64Sn-35Bi-1Ag solder on FR-4 PCB board plated with Cu

Electrochemical migration (ECM) characteristic is a new reliability failure. A parallel surfacial electrode system coupling with scanning electron microscope (SEM), energy dispersive X-ray analysis (EDAX), and X-ray Diffraction (XRD) technologies is designed to research ECM behavior of 64Sn-35Bi-1Ag (SBA) solder in 3.5 g/L NaCl solution and compare to that of Sn37Pb and Sn-3.0Ag-0.5Cu (SAC) solders. Results show that SBA solder is more susceptible to ECM failure than Sn37Pb solder, which is more difficult than SAC solder. The affected factors of ECM are given as follows: the solder compositions, the loaded electric field, ECM time, etc. The electrochemical reaction mechanism of ECM process is achieved. EDAX and XRD analyses show that the main contents on dendrites of SBA solder after ECM test are Sn, hardly any Bi, a little Ag, which illustrates that the order of ion migration capacity is shown as follows: Sn Ag Bi.     

温度循环条件下镀锡引脚的晶须生长

在热循环条件下,对电镀纯Sn覆层的器件引脚的锡须生长进行了评估.当器件经历500与1 000次温度循环后,纯Sn镀层表面会产生致密的热疲劳裂纹,伴随生长出许多锡须.由于镀层表面的SnO2氧化膜与镀层中Sn的热膨胀系数(CTE)存在较大的差异,在温度循环条件下发生SnO2与Sn的热失配,进而在其界面处产生了极大的交变应力,最终导致SnO2氧化膜破裂,为锡须生长提供了条件.此外,在Sn镀层与Cu基板界面处形成的Sn-Cu金属间化合物(IMC),提供了锡须生长的驱动力.镀层中的Sn原子在压应力的驱动下,沿着氧化物表面裂纹位置挤出,从而释放了压应力形成锡须.在锡须生长的初始阶段,阻力较大,故而速率较慢,在锡须突破表面氧化物层后,阻力较小,故加速了锡须的生长.     

SnBi/Cu焊接接头的剪切性能及界面微观组织分析

通过对断口形貌和界面微观组织的观察分析,研究了3种Sn-Bi/Cu焊接接头的剪切断裂机理.结果表明:3种Sn-Bi/Cu焊接接头均在弹性变形阶段断裂,并且均沿Sn-Bi焊料/Cu基板界面处断裂.孔洞降低了3种Sn-Bi/Cu焊接接头的有效连接面积,从而降低了其剪切强度.根据3种Sn-Bi/Cu焊接接头断口形貌,Sn59.9Bi40Cu 0.1/Cu和Sn57.9Bi40Zn2Cu 0.1/Cu焊接接头剪切断裂机制属于准解理、沿晶脆性断裂和韧窝的混合型断裂,而Sn42Bi58/Cu焊接接头剪切断裂机制属于准解理断裂.微观组织分析显示,3种焊料合金焊接接头界面处的金属间化合物层均为连续的Cu₆Sn₅相.     

Sn-20Bi-X无铅焊料的显微组织和物理性能

采用合金化的方法,以Sn-20Bi合金为基础,研究了添加第三组元Ag,ln,Ga或Sb对Sn-Bi合金微观结构、物理性能的影响．结果表明:在Sn-20Bi中加入0．7%的Ag,0．5%的Ga,0．1%的In可使脆硬相Bi细小分散,偏析减少,合金熔化温度降低,获得较好的组织和性能;Sb作为单独的第三组元加入,使Sn-Bi-Sb合金中Bi的偏析较多,硬度有所上升．     

Low melting point nanocrystalline Sn–Ag solder synthesized by a refined chemical reduction method

The commercial market of Sn-Pb solder is gradually decreasing due to its toxicity, calling for Pb-free substitute materials. Sn-Ag alloy is a potential candidate in terms of good mechanical property. The major problematic issue of using Sn-Ag is their high melting temperature, consequently this study is dedicated to lowering the melt- ing temperature of Sn3.5Ag （wt%） alloy by developing nanomaterials using a chemical reduction approach. The resultant nanocrystalline Sn3.5Ag is characterized by field emission scanning electron microscope. The size dependence of the melting temperature is discussed based on differential scanning calorimetry results. We have reduced the melting temperature to 209.8 ℃ in the nanocrystalline Sn3.5Ag of （32.4± 8.0） nm, compared to ～221 ℃ of the bulk alloy. The results are consistent with the prediction made by a relevant theoretical model, and it is possible to further lower the melting temperature using the chemical reduction approach developed by this study.     

Ag对Sn-57Bi无铅钎料组织和性能的影响

研究了在Sn-57Bi近共晶合金的基础上加入少量的Ag后对Sn-57Bi钎焊料铸态组织、抗拉强度和Sn-57Bi／Cu焊接性能的影响。试验结果表明，ωAg=0．1％～1．0％可使合金的共晶组织变细，β-Sn枝晶相的尺寸变小，提高其抗拉强度；使Sn-57Bi／Cu接头的剪切强度有所提高。     

Effect of Ag and Ni on the melting point and solderability of SnSbCu solder alloys

To improve the properties of Sn10Sb8Cu solder alloy, two new solders (SnSbCuAg and SnSbCuNi) were formed by adding small amounts of Ag or Ni into the solder alloy. The results show that the melting point of the SnSbCuAg solder alloy decreases by 14.1℃ and the spreading area increases by 16.5% compared to the matrix solder. The melting point of the SnSbCuNi solder alloy decreases by 5.4℃ and the spreading area is slightly less than that of the matrix solder. Microstructure analysis shows that adding trace Ag makes the melting point decline due to the dispersed distribution of SnAg phase with low melting point. Adding trace Ni, Cu₆Sn₅ and (Cu, Ni)₆Sn₅ with polyhedron shape on the copper substrate can be easily seen in the SnSbCuNi solder alloy, which makes the viscosity of the melting solder increase and the spreading property of the solder decline.     

Microstructural evolutions of Cu(Ni)/AuSn/Ni joints during reflow

Interfacial reactions of the Ni/AuSn/Ni and Cu/AuSn/Ni joints are experimentally studied at 330℃for various reflow times.The microstructures and mechanical properties of the as-solidified solder joints are examined.The as-solidified solder matrix of Ni/AuSn/Ni presents a typical eutecticξ-(Au,Ni)_5Sn+δ-(Au,Ni)Sn lamellar microstructure after reflow at 330℃for 30 s.After reflow for 60 s,a thin and flat(Ni,Au)_3Sn_2 intermetallic compound(IMC) layer is formed,and some needle-like(Ni,Au)_3Sn_2 phases grow f...     

大厂花岗岩Sn,Cu,Zn的分配规律及成矿性评价

基于Ｎｅｒｎｅｓｔ分配定律，本文对广西大厂矿田花岗岩成岩过程中Ｓｎ，Ｃｕ，Ｚｎ的分配规律进行了分析研究，结果表明，该花岗岩主要成岩阶段Ｓｎ，Ｃｕ，Ｚｎ趋于分散，不利成矿；晚期岩浆阶段Ｚｎ，Ｃｕ有一定的成矿性，但不利形成超大型矿床。     

Effect of indium addition on the microstructural formation and soldered interfaces of Sn-2.5Bi-1Zn-0.3Ag lead-free solder

The microstructural formation and properties of Sn-2.5Bi-xIn-1Zn-0.3Ag (in wt%) alloys and the evolution of soldered interfaces on a Cu substrate were investigated. Apart from the relatively low melting point (about 195℃), which is close to that of conventional eutectic Sn-Pb solder, the investigated solder presents superior wettability, solderability, and ductility. The refined equiaxial grains enhance the mechanical properties, and the embedded bulk intermetallic compounds (IMCs) (Cu₆Sn₅ and Cu₅Zn₈) and granular Bi particles improve the joint reliability. The addition of In reduces the solubility of Zn in the β-Sn matrix and strongly influences the separation and growth behaviors of the IMCs. The soldered interface of Sn-2.5Bi-xIn-1Zn-0.3Ag/Cu consists of Cu-Zn and Cu-Sn IMC layers.     

Interfacial intermetallic compound growth and shear strength of low-silver SnAgCuBiNi/Cu lead-free solder joints

The growth rule of the interfacial intermetallic compound (IMC) and the degradation of shear strength of Sn-0.8Ag-0.5Cu-2.0Bi-0.05Ni (SACBN)/Cu solder joints were investigated in comparison with Sn-3.0Ag-0.5Cu (SAC305)/Cu solder joints aging at 373, 403, and 438 K. The results show that (Cu_1?x,Ni_x)₆Sn₅ phase forms between the SACBN solder and Cu substrate during soldering. The interfacial IMC thickens constantly with the aging time increasing, and the higher the aging temperature, the faster the IMC layer grows. Compared with the SAC305/Cu couple, the SACBN/Cu couple exhibits a lower layer growth coefficient. The activation energies of IMC growth for SACBN/Cu and SAC305/Cu couples are 111.70 and 82.35 kJ/mol, respectively. In general, the shear strength of aged solder joints declines continuously. However, SACBN/Cu solder joints exhibit a better shear strength than SAC305/Cu solder joints.