生长条件对TiO_2薄膜结构及光学性能的影响

为了研究TiO2薄膜的生长机制及结构对其带隙的影响,采用激光脉冲沉积方法在超高真空下制备了TiO2薄膜.X射线衍射结果显示在不同温度和不同缓冲层上生长的TiO2薄膜以板钛矿结构为主,缓冲层对薄膜结构影响不大,高的生长温度提高了薄膜的结晶度.透射谱的结果表明,随着生长温度和生长气压的升高,TiO2的带隙逐渐增大,在生长ZnO做为缓冲层后,TiO2薄膜的结晶度降低,随ZnO结晶度的提高,TiO2对复合薄膜带隙的影响消失.     

PLD制备LiMn2O4薄膜及参数对薄膜微观结构的影响

用脉冲激光沉积（PLD）,分别在不锈钢和单晶硅（111）衬底上生长了LiMn2O4薄膜,并对所生长LiMn2O4薄膜的结构进行了研究。结果发现,生长在不锈钢衬底上的薄膜具有粗糙的表面和随机的结晶取向,生长在单晶硅衬底上的薄膜具有相对光滑的表面,并具有明显的（111）方向上的择优取向。还研究了脉冲频率和总脉冲数对薄膜生长的影响,结果显示,在相同的沉积条件下,对于不同衬底,LiMn2O4薄膜的生长率不同;脉冲频率对薄膜生长的影响明显,在相同总脉冲数情况下,脉冲频率大,薄膜生长率明显增大。     

不同脉冲激光沉积距离对TiO2沉积薄膜的影响

应用纳秒脉冲激光沉积技术分别在距离靶面6.0,7.0,8.0,9.0和10.0 cm位置处制备了TiO 2薄膜.基于扫描电镜(SEM)、X射线能谱(EDS)、X射线光电子能谱(XPS)、紫外-可见吸收光谱(UV-Vis spectroscopy)以及四探针测阻表征技术对TiO 2沉积薄膜形貌、元素种类及其分布、元素价态...     

脉冲激光沉积制备薄膜的研究动态

综述了脉冲激光沉积制备薄膜的原理、特点,国内外对脉冲激光沉积的研究应用情况及目前的最新研究方向。着重分析了脉冲激光沉积过程中各主要沉积条件,如激光能量密度、靶－基体距、真空室气压及基体温度等对薄膜质量的影响。     

脉冲激光沉积过程中TiO2等离子体状态诊断及薄膜特性的研究

脉冲激光沉积技术由于具有较高的沉积速率和良好的兼容性,已广泛应用于各种纳米薄膜材料的制备.探究激光等离子体状态与沉积薄膜特性之间的关系,有助于进一步调控与优化脉冲激光技术对薄膜材料的沉积.本文将等离子体状态诊断与沉积薄膜性能相结合,讨论了不同脉冲激光能量下等离子体状态对沉积薄膜性能的影响.结果表明,低烧蚀能量下产生的等离子体更有助于获得质地更好,且与靶材晶相一致的优良薄膜材料.该结果也为探索和调控沉积过程提供参考.     

脉冲激光沉积法制备LiCoO2 薄膜阴极

脉冲激光沉积方法(PLD)制备LiCoO2薄膜的关键因素之一是激光的功率. 在功率不小于160 Mj时,薄膜的结晶程度相对较高,出现(003)晶面的择优取向;且薄膜表面光滑,没有附着尺寸大小不一的纳米颗粒;恒流充放电测试20周内放电容量没有衰减,循环性能好.     

激光沉积法制备光谱选择性透过TiO2薄膜

合理利用太阳光是当今节能与环保学科的重要课题。以钛金属为靶材,在O2气氛中用准分子脉冲激光沉积法(PLD),在石英玻璃基片上制备了钛的金属氧化物薄膜。XRD和AFM研究结果表明,TiO2薄膜透明呈浅褐色,晶粒尺寸在数百nm,成膜均匀致密,光滑平整。经紫外和红外光谱发现:TiO2薄膜反射率为20.7%,是一种低反射薄膜,其在可见光区的透过率约为76%,对紫外的阻隔率大于70%,对近红外的阻隔率大于20%。TiO2薄膜吸波性能和透波性与纳米金属粒子的粒径、形状和排布密切相关。综合考虑紫外区和近红外区的阻隔作用与可见光区的透过率,TiO2在开发抗近红外/紫外的新型隔热薄膜方面具有良好的发展前景。     

溅射时间对脉冲激光沉积制备β-FeSi2薄膜的影响

本文基于脉冲激光沉积 (PLD)方法及热退火处理方式,利用输出波长为1064 nm的Nd:YAG脉冲激光器在P型Si (100) 衬底上生长了均匀的单相 β-FeSi₂薄膜。采用X 射线衍射(XRD)、扫描电镜(SEM)、原子力显微镜(AFM)分析技术,研究了β-FeSi₂薄膜的结构、组分、结晶质量和表面形貌。结果发现,在其他相同沉积条件下,随着溅射时间的增加,薄膜晶化程度、颗粒大小和形状、表面粗糙度都发生规律性变化,通过分析比较得出,在本实验条件下溅射时间为40 min制备的 β-FeSi₂薄膜结晶质量较好。     

黄铜矿结构CuInS2陶瓷和薄膜的制备及性能研究

采用固相烧结法,在真空管式炉中于960℃下保温2h,制备得到具有纯黄铜矿结构均匀致密的CuInS2陶瓷,所制备的陶瓷呈现P型导电且导电性能良好．此外,以自制的CuInS2陶瓷为靶材,采用脉冲激光沉积法在c轴取向的蓝宝石单晶衬底上制备得到高质量的外延CuInS2薄膜．XRD分析表明薄膜具有良好的沿（112）方向外延取向性,透射光谱测试分析得到薄膜光学带隙为1．4eV．     

氧分压对TiO2薄膜微观结构与光吸收性能的影响

采用直流磁控溅射法在不同氧分压下制备TiO2薄膜;研究氧分压对TiO2薄膜的表面形貌、晶体结构、化学组分及光吸收性能的影响.研究结果表明Ti在所有样品中均以 4价态存在;随着氧分压的增大,TiO2薄膜颗粒逐渐变大,薄膜的结晶质量随着氧分压的增大逐渐提高;在吸收光谱中,300 nm 附近的紫外吸收峰随着氧分压的增大而减弱,在330～465 nm 范围内出现1 个吸收谷,且该吸收谷随着氧分压的增大而减小,当氧分压达到0.8 Pa时,吸收谷基本消失.     

沉积电位对ZnO薄膜结构及光电性能的影响

以硝酸锌溶液为电解液,采用电化学沉积方法,在导电玻璃(ITO)上制备ZnO薄膜.使用X射线衍射仪、扫描电子显微镜对制备的ZnO薄膜结构和形貌进行表征,并研究薄膜的光电性能.结果表明,通过该方法制备的ZnO具有标准的六方纤锌矿纳米柱状结构,沉积电位为-0.75、-0.80、-0.85 V时,制备的ZnO纳米柱的直径分别为250、400、500 nm,禁带宽度分别为3.12、3.27、3.29 eV,光电流密度分别为1.18、1.07、0.89μA.cm-2.     

Effects of deposition parameters on the properties of VO_2 thin films

Up to now, much attention has been paid tovanadiumoxide (VOx) thinfil ms due to their exten-sive applications in the infrared microbolometers .Incontrast tothe conventional photon detectors ,the mi-crobolometer using VOxthinfil ms as sensitive materi-als can offer decreased systemcost ,i mproved reliabil-ity,low power-consumption and high sensitivity inthe spectral range of 8—14μm.Vanadiumoxides have various crystal structuresand valency states ,such as VO, V2O3, VO2, V2O5,whichleads tol…     

Effects of substrate temperature and ambient oxygen pressure on growth of Ba(Fe1/2Nb1/2)O3 thin films by pulsed laser deposition

Ba(Fe1/2Nb1/2)O3 thin films were grown on Pt/TiO2/SiO2/Si substrates with pulsed laser deposition (PLD) at temperatures ranging from 823 to 923 K with the varied ambient oxygen pressure. X-ray diffraction (XRD) data confirmed the single phase of polycrystalline Ba(Fe1/2Nb1/2)O3 thin films. The effects of substrate temperature and ambient oxygen pressure on the surface morphologies of the thin films were investigated by atomic force microscopy (AFM) and the growth dynamics of thin films was discussed. Larger grains and denser surface morphologies were observed with increasing substrate temperature. While finer grains were produced with increasing ambient oxygen pressure due to more frequent collisions between the ejected species and ambient oxygen molecules. The influence of the substrate temperature and ambient oxygen pressure on the dielectric properties was also discussed. Improved dielectric constant and decreased dielectric loss was observed for the thin film deposited at evaluated temperature.     

Effects of deposition parameters on the properties of VO2 thin films

The vanadium oxide thin films are deposited for microbolometers by radio frequency reactive sputtering method at room temperature. The effects of the oxygen partial pressure on the deposition rate, electrical properties and compositions of the films are discussed. The as-deposited VO_x thin films with x value of nearly 2 are deposited by adjusting the oxygen partial pressure. After oxidation annealing of these films in air, the VO₂ films with high temperature coefficients of resistivity (about -4%/℃) and low resistivity can be obtained. The square resistances of the films are in the range of 100 kΩ/squ?300 kΩ/squ. All films are deposited at room temperature and annealed at 400℃, in which the compatibility between VO_x deposition process and MEMS (micro electromechanical systems) is greatly improved.     

Effects of deposition parameters on the properties of VO2 thin films

The vanadium oxide thin films are deposited for microbolometers by radio frequency reactive sputtering method at room temperature. The effects of the oxygen partial pressure on the deposition rate, electrical properties and compositions of the films are discussed. The as-deposited VO_x thin films with x value of nearly 2 are deposited by adjusting the oxygen partial pressure. After oxidation annealing of these films in air, the VO₂ films with high temperature coefficients of resistivity (about -4%/℃) and low resistivity can be obtained. The square resistances of the films are in the range of 100 kΩ/squ?300 kΩ/squ. All films are deposited at room temperature and annealed at 400℃, in which the compatibility between VO_x deposition process and MEMS (micro electromechanical systems) is greatly improved.     

Effect of oxygen partial pressure and transparent substrates on the structural and optical properties of ZnO thin films and their performance in energy harvesters

Zinc oxide (ZnO) thin films were deposited onto different substrates-tin-doped indium oxide (ITO)/glass, ITO/polyethylene naphthalate (PEN), ITO/polyethylene terephthalate (PET)-by the radio-frequency (RF) magnetron sputtering method. The effect of various O₂/(Ar+O₂) gas flow ratios (0, 0.1, 0.2, 0.3, 0.4, 0.5, and 0.6) was studied in detail. ZnO layers deposited onto ITO/PEN and ITO/PET substrates exhibited a stronger c-axis preferred orientation along the (0002) direction compared to ZnO deposited onto ITO/glass. The transmittance spectra of ZnO films showed that the maximum transmittances of ZnO films deposited onto ITO/glass, ITO/PEN, and ITO/PET substrates were 89.2%, 65.0%, and 77.8%, respectively. Scanning electron microscopy (SEM) images of the film surfaces indicated that the grain was uniform. The cross-sectional SEM images showed that the ZnO films were columnar structures whose c-axis was perpendicular to the film surface. The test results for a fabricated ZnO thin film based energy harvester showed that its output voltage increased with increasing acceleration of external vibration.     

沉积方式对HfO2薄膜激光损伤阈值的影响

分别采用电子束蒸镀、离子束辅助沉积、离子束反应辅助沉积、双离子束溅射技术制备了二氧化铪薄膜,研究了薄膜的光学特性、缺陷、残余应力、弱吸收和抗激光损伤阈值.发现离子束反应辅助沉积的二氧化铪薄膜具有低的缺陷密度和高的损伤阈值;双离子束溅射的二氧化铪薄膜具有高的折射率、高的残余应力和低的损伤阈值.对二氧化铪薄膜的损伤阈值与上述特性之间的依赖关系进行了讨论,发现残余应力是影响薄膜抗激光损伤阈值的一个重要原因.     

基于磁过滤阴极真空弧沉积技术制备AlCrTiZrMo非晶高熵合金薄膜及其性能研究

基于磁过滤阴极真空弧沉积技术研究了负偏压对AlCrTiZrMo非晶高熵合金薄膜的形貌、元素以及微观结构的影响,进而讨论了AlCrTiZrMo非晶高熵合金薄膜的成膜及结晶机制．通过SEM、EDS、XRD和TEM对薄膜的形貌与结构等性能进行测试分析,实验结果表明:不同沉积离子能量条件下,薄膜具有优异的表面品质;随着沉积离子能量的不断增加,薄膜厚度随之减小;同时,沉积离子能量对高熵晶相的调控有明显效果,沉积离子能量的增加使AlCrTiZrMo高熵合金薄膜微结构从非晶相(am)转变为相稳定的am+FCC纳米复合结构．      

体系pH对MoO_3薄膜结构及光致变色性能的影响

采用溶胶-凝胶法制备了MoO3光致变色薄膜,主要探讨溶液pH值对薄膜结构及性能的影响,运用XRD、SEM、UV-Vis-DRS及全自动色差计对氧化钼薄膜的结构及性能进行了表征.实验表明:随溶液pH值的升高,MoO3薄膜光致变色性能先增强后减弱.pH=1.0时薄膜结晶度较好,颗粒粒径较小,分布较均匀,激发波长蓝移,薄膜的吸收光波区域变宽,色差值达到2.427,光致变色性能提高.