| X射线衍射强度公式的修正 |
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| 引用本文： | 巴诺,高海欣,刘晓静,吴向尧,张玉梅,张斯淇,王婧,郭义庆. X射线衍射强度公式的修正[J]. 吉首大学学报(自然科学版), 2012, 33(1): 41-45. DOI: 10.3969/j.issn.1007-2985.2012.01.011 |
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| 作者姓名： | 巴诺 高海欣 刘晓静 吴向尧 张玉梅 张斯淇 王婧 郭义庆 |
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| 作者单位： | (1.吉林师范大学物理学院，吉林 四平 136000；2.中国科学院高能物理所，北京 100049） |
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| 基金项目： | 吉林省教育厅科学研究资助项目 |
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| 摘 要： | X射线衍射技术在物相分析、点阵参数测量以及微应力的测定等方面被广泛应用，为了更精确地确定物理参数，X射线衍射强度的精确计算是十分重要的.目前单晶X射线衍射的强度公式的理论计算结果与实验数据有较大偏差.对衍射强度公式进行合理修正，使计算结果得到较大改善，并与实验测量的数据符合得更好.
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| 关 键 词： | X射线衍射 晶体结构 修正 |
The Modified of the X-Ray Diffraction Intensity Formula |
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| BA Nuo,GAO Hai-xin,LIU Xiao-jing,WU Xiang-yao,ZHANG Yu-mei,ZHANG Si-qi,WANG Jing,GUO Yi-qing. The Modified of the X-Ray Diffraction Intensity Formula[J]. Journal of Jishou University(Natural Science Edition), 2012, 33(1): 41-45. DOI: 10.3969/j.issn.1007-2985.2012.01.011 |
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| Authors: | BA Nuo GAO Hai-xin LIU Xiao-jing WU Xiang-yao ZHANG Yu-mei ZHANG Si-qi WANG Jing GUO Yi-qing |
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| Affiliation: | (1.Institute of Physics,Jilin Normal University,Siping 136000,Jilin China;2.Institute of High Energy Physics,Chinese Academy of Sciences,Beijing100049) |
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| Abstract: | The X-ray diffraction technology has been widely applied in phase identification,the determination of lattice parameters and the testing of the microstress.In order to precisely determine the physical parameters,the calculation of the X-ray diffraction intensity is very important.At present,comparedg with the experimental data,the theoretical results of the X-ray diffraction intensity formula have a large deviation.In this paper,the X-ray diffraction intensity formula has been modified reasonably and the improved results of the theoretical are in good accordance with the experimental data. |
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| Keywords: | the X-ray diffraction crystal structure revise |
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