基于移频外差的高速光电子器件自校准高频分析

高速光电子器件是大容量光通信系统和宽带微波光子系统的基础，器件的高频响应测量对于实现电光和光电转换具有重要的意义.为此，基于光外差理论提出了移频外差方法用于实现从光域光谱到电域电谱的映射，在电域获得光谱和电谱的联合分析.实验中，通过配置电域谱线的频率关系，利用移频外差将所需光载波和边带从光域映射到电域，实现了高速马赫-曾德尔调制器、相位调制器和光电探测器的自校准高频测试，获得了马赫-曾德尔调制器的调制指数、半波电压和啁啾参数、相位调制器的调制指数、半波电压以及光电探测器的响应度等多种高频参数.结果表明，该方法具有宽频段、高分辨率、多参数、自校准测试的优点.

Self-Calibrated High-Frequency Analysis of High-Speed Optoelectronic Devices by Frequency-Shifted Heterodyne

High-speed optoelectronic devices are key elements for large-capacity optical fiber communication systems and wideband microwave photonic systems, in which the high-frequency characterization of optoelectronic devices is of importance for the precise signal conversion between optical domain and electrical domain. In this paper, we proposed a frequency-shifted heterodyne method based on optical heterodyne theory for mapping signal spectrum from optical domain to electrical domain, in order to obtain the joint analysis of optical spectrum and electrical spectrum in electrical domain. In experiments, we have successfully conducted self-calibrated high-frequency measurements with three devices including Mach-Zehnder modulators, phase modulators and photodetectors by carefully choosing the frequency relationship between the desired mapped electrical spectrum lines. The main characteristic of the devices, such as modulation index,half-wave voltages, chirp and responsivity are extracted. Experimental results indicate that our method is helpful for the wideband, high-resolution, multiparameter, self-calibration measurement of high-speed optoelectronic devices.