| 低功耗内建自测试的参数优选 |
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| 引用本文： | 胡晨,杨军,史又华.低功耗内建自测试的参数优选[J].应用科学学报,2002,20(3):301-304. |
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| 作者姓名： | 胡晨 杨军 史又华 |
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| 作者单位： | 东南大学,国家专用集成电路系统工程技术研究中心,江苏,南京,210096 |
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| 摘 要： | 提出了面向低峰值功耗进行 BIST参数优化的问题 ,给出了相应的种子选取算法 .实验结果表明该方法不需要额外的硬件开销 ,并在保证故障覆盖率的前提下峰值功耗有明显降低
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| 关 键 词： | 内建自测试 低功耗 线性反馈移位寄存器 |
| 文章编号： | 0255-8297(2002)03-0301-04 |
| 修稿时间： | 2001年7月19日 |
Parameter Optimization of Low Power BIST |
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| HU Chen,YANG Jun,SHI You hua.Parameter Optimization of Low Power BIST[J].Journal of Applied Sciences,2002,20(3):301-304. |
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| Authors: | HU Chen YANG Jun SHI You hua |
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| Abstract: | With the fast growing portable electronics market and stricter requirement of the wafer test, the power consumption problem of built in self test (BIST) has attracted more and more attention. In this paper, a parameter optimization algorithm that can lower the peak power during test application has been proposed. Experiment results show that peak power is reduced considerably with no extra silicon overhead of test logic on the condition that fault coverage is guaranteed. |
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| Keywords: | built in self test low power linear feedback shift register |
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