基于红外热像仪的物体表面发射率测量方法

目前利用红外热像仪难以测得物体准确的发射率，因此根据红外热像仪对物体的输出响应，提出了一种新的利用红外热像仪精确测量物体发射率的方法.该方法针对双参考体方法计算公式中n取值不准确之处加以改进，推导出了物体发射率新的计算公式，系统地分析了该方法精确测量物体发射率的条件，建立了一套完整的利用红外热像仪精确测量物体发射率的方法.实验验证表明该方法可获得满意的测量结果.

Surface Emissivity Measurement Technique Based on Infrared Thermal Imager〓

The two reference body method can not measure accurately the emissivity of an object.According to the spectral response of an infrared thermal imager， a new precise measurement method with an infrared thermal imager was developed to measure the emissivity of an object. The determination of the parameter n in the two reference body method is improved， and a new formula for emissivity calculation is obtained. Based on the analysis of the applicable conditions of the new measurement method， a measuring method to obtain accurate object emissivity is presented. Applications show that the measurement results are satisfactory.