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温度对硅纳米线生长结构的影响
引用本文:李梦轲,刘俊,金红,丁圣.温度对硅纳米线生长结构的影响[J].辽宁师范大学学报(自然科学版),2007,30(2):172-174.
作者姓名:李梦轲  刘俊  金红  丁圣
作者单位:辽宁师范大学,物理与电子技术学院,辽宁大连116029
基金项目:中国博士后基金会资助项目(2004036387);辽宁省教育厅科学基金资助项目(20040203).
摘    要:以硅烷为反应气体,温度为850~1100℃,在(100)取向的单晶硅片上,采用化学气相沉积法生长了一维硅纳米线.用扫描电子显微镜观察了硅纳米线的表面形貌,用X射线衍射仪研究了硅纳米线生长结构与反应温度的关系.分析了不同实验条件对硅纳米线生长结构的影响,并对一维硅纳米线与块体硅的光致发光(PL)特性进行了分析比较.

关 键 词:硅纳米线  化学气相沉积  温度  生长结构  光致发光
文章编号:1000-1735(2007)02-0172-03
修稿时间:2006-06-07

The effect of depositing temperature on growth structure and characters of silicon nanowires
LI Meng-ke,LIU Jun,JIN Hong,DING Sheng.The effect of depositing temperature on growth structure and characters of silicon nanowires[J].Journal of Liaoning Normal University(Natural Science Edition),2007,30(2):172-174.
Authors:LI Meng-ke  LIU Jun  JIN Hong  DING Sheng
Institution:School of Physics and Electron Technology, Liaonlng Normal University, Dalian 116029, China
Abstract:By using chemical vapor deposition(CVD) method,silicon nanowires(SiNWs) have been synthesized on single crystal silicon(100) wafers.The SiH4 gas served as a silicon source for the growth of SiNWs.The morphology of prepared SiNWs were studied by scanning electron microscopy(SEM),the growth microstructures of fabricated SiNWs were analyzed by X-ray diffraction(XRD) spectrum and selected-area electron diffraction(SAED) method.The effect of depositing temperature parameters on growth microstructure have been analyzed and discussed.The photoluminescence spectra reveal that SiNWs have a stronger light-emission than bulk silicon.
Keywords:silicon nanowires  chemical vapor deposition  temperature  growth structure  photoluminescence
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