| 电阻隔离测试技术的硬件电路实现 |
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| 引用本文： | 崔大海,汪滨琦,张晶,任冬.电阻隔离测试技术的硬件电路实现[J].应用科技,2007,34(7):46-49. |
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| 作者姓名： | 崔大海 汪滨琦 张晶 任冬 |
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| 作者单位： | 哈尔滨工程大学,自动化学院,黑龙江,哈尔滨,150001 |
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| 摘 要： | 介绍了低值电阻的隔离测试技术，阐述基本方法及理论．在系统组成的框架上，应用单片机、A／D、D／A模块实现硬件电路的设计．简述了A／D、D／A模块的基本结构和与单片机的接口设计．在D／A模块设计中，采用8位精度DAC2级锁存器实现16位的精度．通过台面试验，基本满足设计的测量要求．
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| 关 键 词： | 隔离测试 仪表放大器 |
| 文章编号： | 1009-671X（2007）07-0046-04 |
| 修稿时间： | 2007-04-13 |
Hardware circuit of test technology for resistance isolation |
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| CUI Da-hai,WANG Bin-qi,ZHANG Jing,REN Dong.Hardware circuit of test technology for resistance isolation[J].Applied Science and Technology,2007,34(7):46-49. |
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| Authors: | CUI Da-hai WANG Bin-qi ZHANG Jing REN Dong |
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| Institution: | College of Automation, Harbin Engineering University, Harbin 150001 ,China |
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| Abstract: | The test method of resistance isolation for low resistance resistor is presented, as well as its fundamental methodology and theory. The hardware circuit employes microcontroller, A/D and D/A modules to realize the design. The basic Structure of the A/D, D/A modules and the interface design with microcontroller are introduced briefly. In the design of the D/A module, two-level latches with 8-bit precision DAC are used to achieve 16-bit precision. Through table test, it proves that the system meets the basic test requirement and can work steadily during the test. |
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| Keywords: | A/D D/A |
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