|
|||||
|
|
Estimates of EEPROM Device Lifetime |
|
| Authors: | Leilei Li Zongguang Yu î &#x; Yue Hao Ý Ü |
| Institution: | a School of Microelectronics, Xidian University, Xi'an, 710071, China;b 58th Research Institute, China Electronics Technology Group Corporation, Wuxi 214035, China |
| Abstract: | |
| Keywords: | electrically erasable programmable read-only memory (EEPROM) time dependent dielectric breakdown (TDDB) breakdown charge |
| 本文献已被 CNKI ScienceDirect 等数据库收录！ | |