| 极低温SMD器件S参数提取技术研究 |
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| 引用本文： | 段容宜,刘英,夏桂书.极低温SMD器件S参数提取技术研究[J].科学技术与工程,2015,15(14). |
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| 作者姓名： | 段容宜 刘英 夏桂书 |
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| 作者单位： | 中国民用航空飞行学院航空工程学院,广汉,618307 |
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| 基金项目： | 国家自然科学基金委员会与中国民航总局联合资助项目(U1233202)；中国民航飞行学院科研项目(J2007-20)。 |
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| 摘 要： | 对SMD器件的参数提取技术发展和研究现状进行介绍.分析研究了嵌入的测试网络对被测件的参数提取的影响。设计了一套对极低温环境下的微波器件的参数提取系统,实现SMD器件在低温环境下的相关参数提取,为低温下的微波电路设计提供了有力的技术方案。
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| 关 键 词： | 极低温 去嵌入式技术 S参数提取 |
| 收稿时间： | 2014/12/30 0:00:00 |
| 修稿时间： | 2015/3/18 0:00:00 |
S-parameter Extraction Technology Research of SMD Devices at the Extremely Low Temperature |
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| DUAN Rongyi,LIU Ying and XIA Guishu.S-parameter Extraction Technology Research of SMD Devices at the Extremely Low Temperature[J].Science Technology and Engineering,2015,15(14). |
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| Authors: | DUAN Rongyi LIU Ying and XIA Guishu |
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| Abstract: | This article is about introducing the development of parameter extraction technology and research status about SMD components, analyzing and researching the effect of parameter extraction about the embedded test network to measuring piece. A new parameter extraction system which can test components at very low temperatures was being designed. It makes SMD components worked at very low temperatures, and it provide technical support for project of microwaudio-videoe and circuit at very low temperatures. |
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| Keywords: | low temperature de-embedded technique S-parameter extraction |
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