| X射线荧光熔片法测定人造富矿中主要成分的新方法 |
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| 引用本文： | 任校丹,刘磊.X射线荧光熔片法测定人造富矿中主要成分的新方法[J].科学技术与工程,2006,6(18):2964-2966. |
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| 作者姓名： | 任校丹 刘磊 |
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| 作者单位： | 济南钢铁集团总公司技术监督处,济南,250101 |
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| 摘 要： | 利用PANalytical Axios（PW4400）仪器的优越性，对人造富矿中主要成分进行了测定，给出了元素的干扰和基体效应校正系数，分析数据准确可靠。
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| 关 键 词： | X荧光光谱法 人造富矿 干扰 |
| 文章编号： | 1671-1815（2006）18-2964-03 |
| 收稿时间： | 2006-06-07 |
| 修稿时间： | 2006年6月7日 |
A New Determaintion of Major Element in Synthetic Ore by X-ray Fluorescence Spectrum |
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| REN Xiaodan,LIU Lei.A New Determaintion of Major Element in Synthetic Ore by X-ray Fluorescence Spectrum[J].Science Technology and Engineering,2006,6(18):2964-2966. |
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| Authors: | REN Xiaodan LIU Lei |
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| Abstract: | The experimentation for determination of major elements in synthetic ore was developed by PANalytical Axios (PW4400) X-ray fluorescence spectrometer, correction factors of line overlappe and correction for matrix effects were given. XRF analysis results of samples were accurate and reliable by using this method. |
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| Keywords: | X-ray fluorescence spectrum synthetic ore ovedappa |
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