| 表面分析的新方法—（RHEED－TRAXS）和（SEM－TRAXS） |
| |
| 引用本文： | 姚子华.表面分析的新方法—（RHEED－TRAXS）和（SEM－TRAXS）[J].河北大学学报(自然科学版),1994(2). |
| |
| 作者姓名： | 姚子华 |
| |
| 作者单位： | Center of physical and Chemical Analysis，Baoding，Hebei University 071002 |
| |
| 摘 要： | 本文综述在反射高能电子衍射仪中测量全反射角ｘ射线谱（简称ＲＨＥＥＤ－ＴＲＡＸＳ）的表面化学分析方法。对这种分析方法的基本原理、主要优点及应用作了概略介绍。本文还介绍了在扫描电镜中进行全反射角ｘ射线谱（简称ＳＥＭ－ＴＲＡＸＳ）测量的方法及结果，并在文章的末尾指出了在扫描中实现（ＳＥＭ－ＲＨＥＥＤ－ＴＫＡＸＳ）的可能性。
|
| 关 键 词： | 反射高能电子衍射（RHEED），表面，表面分析，x射线全反射临界角，x射线能谱分析，扫描电子显微镜 |
The New Methods of Chemical Analysis for Surface-RHEED-TRAXS and SEM-TRAXS |
| |
| Yao Zihua.The New Methods of Chemical Analysis for Surface-RHEED-TRAXS and SEM-TRAXS[J].Journal of Hebei University (Natural Science Edition),1994(2). |
| |
| Authors: | Yao Zihua |
| |
| Abstract: | A new nethod for chemical analysis of the surfaces by total reflaction angleX-ray spectroscopy in reflection high energy electron diffraction(RHEED-TRAXS)isdescribed.The fundamental principles and advantagies of the method and the applycationof the method to surface analysis are described.The total reflection angle X一rayspectroscopy in scanning electron microscopy(SEM-TRAXS)is also described.At end ofthe paper we prefigure that SEM-RHEED-TRAXS will arrive in scanning electronmicroscopy. |
| |
| Keywords: | Reflection high energy electron diffraction(RHEED)SurfaceSuface analysis Critical angle of X-ray total reflection X-ray energy dispersivespectroscopy Scanning electron microscopy |
| 本文献已被 CNKI 等数据库收录！ |
