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磁控溅射薄膜的厚度均匀性理论研究
引用本文:胡作启,李佐宜,缪向水,刘卫忠.磁控溅射薄膜的厚度均匀性理论研究[J].华中科技大学学报(自然科学版),1996(1).
作者姓名:胡作启  李佐宜  缪向水  刘卫忠
作者单位:华中理工大学固体电子学系
摘    要:建立了一个磁控溅射模型,在几种特殊情况下,给出了计算机模拟的薄膜厚度三维分布和二维分布,提出了制备大面积薄膜的条件.结果表明:计算机模拟的结果与实验结果和有关文献的结果一致.

关 键 词:磁控溅射  薄膜厚度  磁场  模型

On the Thickness Uniformity of Films Deposited by Magnetron Sputtering
Hu Zuoqi, Li Zucyi,Miao Xiangshui, Liu Weizhong.On the Thickness Uniformity of Films Deposited by Magnetron Sputtering[J].JOURNAL OF HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY.NATURE SCIENCE,1996(1).
Authors:Hu Zuoqi  Li Zucyi  Miao Xiangshui  Liu Weizhong
Institution:Hu Zuoqi; Li Zucyi;Miao Xiangshui; Liu Weizhong
Abstract:A magnetron sputtering model is developed by taking the distribution of magnetron magnetic field into consideration.In a few special cases,the relative thickness distribution in three dimensions and two dimensions of the deposited films are given by mathematical integration.The methods of depositing the films of a large area are proposed.It is shown that the results of computer simulation are in agreement with those of experiments and published literature.
Keywords:s: magnetron sputtering  film thickness  magnetic field  model
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