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多芯片组件中带裂缝电源/接地板同步开关噪声分析
引用本文:王德东,李征帆.多芯片组件中带裂缝电源/接地板同步开关噪声分析[J].上海交通大学学报,2002,36(12):1785-1787.
作者姓名:王德东  李征帆
作者单位:上海交通大学,电子工程系,上海,200030
基金项目:国家自然科学基金资助项目 (6993 10 2 0 )
摘    要:电源接地板上的同步开关噪声是制约高速电路发展的瓶颈,而目前同步开关噪声分析集中于规则电源接地板,与实际电路有一定差距。文中基于部分等效元方法分析多芯片组件中带裂缝的电源/接地板上的同步开关噪声;对不同尺寸位置的裂缝引起的同步开关噪声进行相应的时域模拟,得出了多芯片组件中电源/接地板上裂缝对同步开关噪声的影响。

关 键 词:裂缝  电源/接地板  多芯片组件  同步开关噪声  部分等效元法  时域模拟  集成电路
文章编号:1006-2467(2002)12-1785-03

Analysis of the Voltage Bounce on Power/Ground Planes with Aperture and Slit
WANG De-dong,LI Zheng-fan.Analysis of the Voltage Bounce on Power/Ground Planes with Aperture and Slit[J].Journal of Shanghai Jiaotong University,2002,36(12):1785-1787.
Authors:WANG De-dong  LI Zheng-fan
Abstract:With the increase of ICs speed, the power/ground voltage bounces on the power gound planes pair of the multi chip module becomes the bottleneck of the development of high speed ICs. The current study of the power/ground voltage bounces is focused on the regular planes. In this paper, the effect of the apertures on MCM's power/ground planes was analyzed, it mainly increases the voltage bounces on the power/ground planes of MCMs, this effect is evaluated by using the PEEC model of such power/ground system.
Keywords:multi chip module (MCM)  power/ground voltage bounces  partial-element equivalent circuit (PEEC)
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