| 固体电介质中电致陷阱产生与电子捕获动力学 |
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| 引用本文： | 刘付德,凌志远.固体电介质中电致陷阱产生与电子捕获动力学[J].华南理工大学学报(自然科学版),1993,21(1):100-107. |
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| 作者姓名： | 刘付德 凌志远 |
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| 作者单位： | 华南理工大学无机材料科学与工程系，华南理工大学无机材料科学与工程系，华南理工大学无机材料科学与工程系，华南理工大学无机材料科学与工程系，华南理工大学无机材料科学与工程系 |
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| 摘 要： | 考虑了固体电介质结构劣化的共同特点,本文从理论上表述了在宽广电场范围(10~5V/cm～击穿)作用下介质中电致陷阱产生的动力学过程,并以一级捕获动力学方程为依据,获得了包含新陷阱的陷阱捕获电子动力学特性方程,最后文中提出表面电位模型,实现了对这些动力学特性的研究,根据研究结果提出电击穿过程新模型。
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| 关 键 词： | 陷阱 捕获电子 固体 电介击穿 |
KINETICS OF TRAP GENERATION AND ELECTRONS CAPTURE IN SOLID DIELECTRICS UNDER HIGH ELECTRICAL STRENGTH |
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| Liufu De,Ling Zhiyuan,Xie Jin,Zhang Suizhen and Zhuang Zhiqiang Dept.of Inorg.Mat.Science & Eng.,South China Univ.of Tech..KINETICS OF TRAP GENERATION AND ELECTRONS CAPTURE IN SOLID DIELECTRICS UNDER HIGH ELECTRICAL STRENGTH[J].Journal of South China University of Technology(Natural Science Edition),1993,21(1):100-107. |
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| Authors: | Liufu De Ling Zhiyuan Xie Jin Zhang Suizhen and Zhuang Zhiqiang Deptof InorgMatScience & Eng South China Univof Tech |
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| Abstract: | Considering the common characteristics of structuredegrading in solid dielectrics,a kinetic equation of trap creationand electrons capture under the application of wide range ofelectrical fisld(from 10~5V/cm to breakdown)is deduced in thispaper.Becides a measuring technology with surface potential isproposed to study such behaviours Then a new breakdown mecha-nism is suggested by taking account of the phenomena of trapcreation and detrapping due to impacting ionization between freeelectrons and the trapped. |
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| Keywords: | solid insulating materials traps trapped electron dynamics |
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