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金属辅助湿法化学刻蚀黑硅机理的探讨
引用本文:廖承菌,杨培志,廖华,李学铭.金属辅助湿法化学刻蚀黑硅机理的探讨[J].云南师范大学学报(自然科学版),2013(5):22-28.
作者姓名:廖承菌  杨培志  廖华  李学铭
作者单位:[1]可再生能源材料先进技术与制备教育部重点实验室,云南昆明650092 [2]云南师范大学太阳能研究所,云南昆明650092 [3]不详,云南昆明650092
基金项目:国家自然科学基金资助项目(61066004,U1037604).
摘    要:为了理解金属辅助湿法化学刻蚀的机理,单晶硅片分别在氢氟酸/过氧化氢/氯金酸(HF/H2O2/HAuCl4)体系、氢氟酸/硝酸/硝酸银(HF/HNO3/AgNO3)体系、氢氟酸/过氧化氢/硝酸铜(HF/H2O2/Cu(NO3)2)体系中被刻蚀,经过三种体系刻蚀的单晶硅样品的减重量与减薄量之比值分别约为1.622、0.960、0.560.利用电动模型分析认为:差异性刻蚀的发生主要取决于电子的得失和电荷的传输两个方面。

关 键 词:黑硅  增强广谱吸收  金字塔绒面

Investigation on the Mechanism of Metal-assisted Chemical Etching Used for Black Silicon Preparation
LIAO Cheng-jun,YANG Pei-zhi,LIAO Hua,LI Xue-ming.Investigation on the Mechanism of Metal-assisted Chemical Etching Used for Black Silicon Preparation[J].Journal of Yunnan Normal University (Natural Sciences Edition),2013(5):22-28.
Authors:LIAO Cheng-jun  YANG Pei-zhi  LIAO Hua  LI Xue-ming
Institution:1. Advanced Technology and Manufacturing Key Lab on Renewable Energy Materials of the Ministry of Education of China, Kunming 650092, China; 2. Solar Energy Research Institute, Yunnan Normal University, Kunming 650092, China)
Abstract:In order to understand the mechanism of metal-assisted chemical etching,silicon wafer was etched using metal-assisted chemical etching under HF/H2O2/HAuC14 system,HF/HNO3/AgNO3 system,HF/H2O2/Cu(NO3)2 system,respectively.The results show that the silicon wafer,which reduced weight and the ratio of reduced thickness is 1.622,0.960,0.560,respectively.The occurrence of differences in etching depends mainly on two aspects of the electric charge transfer and its gains and losses.
Keywords:Black silicon  Enhanced wide spectral absorption  Pyramid texturing
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