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模拟退火算法在低功耗BIST中的应用
引用本文:胡晨,张哲,史又华,杨军,时龙兴.模拟退火算法在低功耗BIST中的应用[J].东南大学学报(自然科学版),2002,32(2):177-180.
作者姓名:胡晨  张哲  史又华  杨军  时龙兴
作者单位:东南大学国家专用集成电路系统工程技术研究中心,南京,210096
基金项目:国家自然科学基金资助项目 (60 1760 18)
摘    要:提出了应用模拟退火算法在一定长度的测度矢量集中寻找有效测试矢量的近似最优分组,在尽量减少面积开销的同时减少有效测试矢量的个数,并且通过置入种子的方法使LFSR产生近似最优分组的矢量,因此在保障故障盖主的前提下达到了降低测试功耗的目的。实验表明,采用此方法可降低测试功耗70%以上,而故障覆盖维持不变,此外,由于减少了测试矢量,测试时间也大为缩短,在实时系统中,减少测试时间尤为重要。

关 键 词:模拟退火算法  内建自测试  低功耗BIST  可测性设计  集成电路  故障覆盖率
文章编号:1001-0505(2002)02-0177-04

Simulated annealing algorithm applied in low power BIST scheme
Hu Chen,Zhang Zhe Shi Youhua,Yang Jun,Shi Longxing.Simulated annealing algorithm applied in low power BIST scheme[J].Journal of Southeast University(Natural Science Edition),2002,32(2):177-180.
Authors:Hu Chen  Zhang Zhe Shi Youhua  Yang Jun  Shi Longxing
Abstract:An approach to approximately optimal group test vectors in a certain length of test patterns is proposed to decrease the number of test vectors based on simulated annealing algorithm. By the scheme of reseeding, this approach makes linear feedback shift register (LFSR) generate optimized groups of vectors, so as to reduce the power consumption without any loss of fault coverage. The experiment result shows that more than 70% power consumption can be reduced while keeping the fault coverage invariable. In addition, the test time is greatly shortened with decreased number of test vectors, which is important in real time device.
Keywords:low  power consumption  stimulated annealing  BIST  
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