| 纳米Al2O3薄膜的结构与性能 |
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| 引用本文： | 张亚增,杜先智.纳米Al2O3薄膜的结构与性能[J].安徽师范大学学报(自然科学版),1995,18(3):27-30. |
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| 作者姓名： | 张亚增 杜先智 |
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| 摘 要： | 本工作用直流叠加方波脉冲电流，对铝合金进行阳极氧化，制得了纳米Ａｌ２Ｏ３薄膜；用透射电镜、介电场强和显微硬度测定以及荧光光谱等手段研究了它的显微结构和有关物理性质。结果表明纳米Ａｌ２Ｏ３薄膜具有较高的介电强度、硬度和相对强度为６８．２％的兰绿色荧光发光谱等优异性能。
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| 关 键 词： | 纳米材料 薄膜 三氧化二铝 显微结构 物理性质 |
Structure and Properties of nm-Al_2O_3 Films |
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| Zhang Yazeng, Du Xianzhi.Structure and Properties of nm-Al_2O_3 Films[J].Journal of Anhui Normal University(Natural Science Edition),1995,18(3):27-30. |
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| Authors: | Zhang Yazeng Du Xianzhi |
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| Institution: | Department of Physics |
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| Abstract: | In this paper,We was investigated the growth process of thin films of Al_2O_3,wich made by anode oxidization method.The relation between some physical propertiesand micro-Structure of nm-Al_2O_3 films has been discussed. |
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| Keywords: | Nanometer-sized materials anodic oxidation Al_2O_3 films |
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