| 有源器件伏安特性测试仪的研制 |
| |
| 引用本文： | 王平,李琳,张奇志.有源器件伏安特性测试仪的研制[J].西安石油大学学报(自然科学版),2001,16(4):63-65. |
| |
| 作者姓名： | 王平 李琳 张奇志 |
| |
| 作者单位： | 1. 石油大学自动化系,山东东营 257062
2. 西安石油学院,陕西西安 710065 |
| |
| 摘 要： | 提出了利用窄脉冲、定电压、电子负载进行自动测量有源器件伏安特性的新方法 ,该方法既可测出真实的短路电流 ,且能保证内阻较小的有源器件不会在测量过程中因过热而损坏 ,给出了测量系统硬件电路框图 ,该测量系统由定电压电子负载电路、峰值采样 -保持电路和单片机测控线路三部分组成 .测试实例表明 ,该方法的平均误差测量小于 0 .1 % .
|
| 关 键 词： | 有源器件 伏安特性 测试仪器 |
| 文章编号： | 1001-5361(2001)04-0063-03 |
| 修稿时间： | 2000年7月12日 |
Development of the Instrument for Testing Active Device's Voltage-Current Characteristic |
| |
| WANG Ping,LI Lin,ZHANG Qi zhi.Development of the Instrument for Testing Active Device's Voltage-Current Characteristic[J].Journal of Xian Shiyou University,2001,16(4):63-65. |
| |
| Authors: | WANG Ping LI Lin ZHANG Qi zhi |
| |
| Abstract: | A new method of testing the voltage-current characteristic of an active device was put forward. By the method, the real shore curcuit current of an active device with little internal resistance can be measured but it may not be damaged because of overheating. The hardware block diagram of the measuring curcuit was presented. The curcuit consists of a narrow pulse fixed voltage electronic load curcuit, a peak current sampling-holding curcuit and a chip microprocessor for measuring and controlling curcuit. An example shows that the avarage measuring error of the curcuit is less than one thousandth. |
| |
| Keywords: | active device voltage-current characteristic measurement instrument |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
