| ZC36微电流测试仪测量非晶硅有效隙态密度 |
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| 引用本文： | 唐元洪.ZC36微电流测试仪测量非晶硅有效隙态密度[J].湖南大学学报(自然科学版),1997,24(3):17-20. |
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| 作者姓名： | 唐元洪 |
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| 作者单位： | 湖南大学应用物理系 |
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| 摘 要： | 首次报告了用国产的廉价的ＺＣ３６型微电流测试仪测量非晶硅有效隙密度的原理和结果，其结果与美国生产的昂贵的４０６１Ａ型半导综合测试仪测量结果相一致。
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| 关 键 词： | 非晶硅 隙态密度 半导体 微电流测试仪 |
Measurement of Effective Density of Gap States in Amorphous Silicon with Type of ZC36 Microgalvanometer |
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| Tang Yuanhong.Measurement of Effective Density of Gap States in Amorphous Silicon with Type of ZC36 Microgalvanometer[J].Journal of Hunan University(Naturnal Science),1997,24(3):17-20. |
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| Authors: | Tang Yuanhong |
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| Abstract: | The principle and result of measuring effective density of gap states in amor- phous silicon with type of ZC36 micmgalvanometer which is cheap equipment made in P R China are first reported in this paper. The result is in agreement with one measured with type of 4061A semiconductor synthetical measurement equipment which is expensive made in U . S. A. |
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| Keywords: | amorphous silicon measurement equipment gap state density |
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