| 双参数指数分布场合下无失效数据的可靠性试验 |
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| 引用本文： | 高风昕,彭真,赵占平.双参数指数分布场合下无失效数据的可靠性试验[J].河南科学,2010,28(10):1221-1224. |
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| 作者姓名： | 高风昕 彭真 赵占平 |
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| 作者单位： | 1. 黄淮学院,河南驻马店,463000
2. 云南大学,昆明,650091 |
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| 基金项目： | 高等学校博士学科点专项科研基金项目 |
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| 摘 要： | 在电器的可靠性指标达到某个给定值的情况下,利用Bayes方法给出电器的寿命服从双参数指数分布场合下无失效数据的可靠性验证试验,并利用相同的分析方法给出形状参数的1-α的Bayes可信上限和形状参数的Bayes估计.最后,结合实例进行了计算,结果表明,利用该估计方法优于经典估计方法.
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| 关 键 词： | 无失效数据 可靠性 双参数指数分布 Bayes估计 |
The Reliable Experiment for Two-Parameter Exponential Distribution on Zero-Failure Data |
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| Gao Fengxin,Peng Zhen,Zhao Zhanping.The Reliable Experiment for Two-Parameter Exponential Distribution on Zero-Failure Data[J].Henan Science,2010,28(10):1221-1224. |
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| Authors: | Gao Fengxin Peng Zhen Zhao Zhanping |
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| Institution: | Gao Fengxin,Peng Zhen,Zhao Zhanping (1.Huang-Huai University,Zhumadian 463000,Henan China,2.Yunnan University,Kunming 650091,China) |
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| Abstract: | When the electrical reliability index comes to a given value,Bayes method was used to give the electronic products＇life is in accordance with the two-parameter exponential distribution under the failure data of the Reliability Test,and using the same analysis method gives shape parameters of the Bayes confidence limit of 1-α and Bayes estimates of shape parameters.Finally,calculated results of the case show that using the estimation method is superior to classical estimation. |
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| Keywords: | non-failure data reliability two-parameter exponential distribution Bayes estimation |
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